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Title: Sense Determination of Micropipes via Grazing-Incidence Synchrotron White Beam X-ray Topography in 4H Silicon Carbide

Abstract

Computer modeling using the ray-tracing method has been used to simulate the grazing-incidence x-ray topographic images of micropipes in 4H silicon carbide recorded using the pyramidal (11-28) reflection. Simulation results indicate that the images of micropipes appear as white features of roughly elliptical shape, canted to one side or other of the g vector depending on the dislocation sense. Observed images compare well with the simulations, demonstrating that the direction of cant provides a simple, nondestructive, and reliable way to reveal the senses of micropipes. Sense assignment has been validated using back-reflection reticulography.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
930525
Report Number(s):
BNL-80550-2008-JA
Journal ID: ISSN 0003-6951; APPLAB; TRN: US0901407
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 91; Journal Issue: 7
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; COMPUTERIZED SIMULATION; DISLOCATIONS; GRAZING INCIDENCE TOMOGRAPHY; REFLECTION; SHAPE; SILICON CARBIDES; SYNCHROTRON RADIATION; TOPOGRAPHY; VECTORS; X-RAY DIFFRACTION; national synchrotron light source

Citation Formats

Chen,Y., Dhanaraj, G., Dudley, M., Sanchez, E., and MacMillan, M. Sense Determination of Micropipes via Grazing-Incidence Synchrotron White Beam X-ray Topography in 4H Silicon Carbide. United States: N. p., 2007. Web. doi:10.1063/1.2772190.
Chen,Y., Dhanaraj, G., Dudley, M., Sanchez, E., & MacMillan, M. Sense Determination of Micropipes via Grazing-Incidence Synchrotron White Beam X-ray Topography in 4H Silicon Carbide. United States. doi:10.1063/1.2772190.
Chen,Y., Dhanaraj, G., Dudley, M., Sanchez, E., and MacMillan, M. Mon . "Sense Determination of Micropipes via Grazing-Incidence Synchrotron White Beam X-ray Topography in 4H Silicon Carbide". United States. doi:10.1063/1.2772190.
@article{osti_930525,
title = {Sense Determination of Micropipes via Grazing-Incidence Synchrotron White Beam X-ray Topography in 4H Silicon Carbide},
author = {Chen,Y. and Dhanaraj, G. and Dudley, M. and Sanchez, E. and MacMillan, M.},
abstractNote = {Computer modeling using the ray-tracing method has been used to simulate the grazing-incidence x-ray topographic images of micropipes in 4H silicon carbide recorded using the pyramidal (11-28) reflection. Simulation results indicate that the images of micropipes appear as white features of roughly elliptical shape, canted to one side or other of the g vector depending on the dislocation sense. Observed images compare well with the simulations, demonstrating that the direction of cant provides a simple, nondestructive, and reliable way to reveal the senses of micropipes. Sense assignment has been validated using back-reflection reticulography.},
doi = {10.1063/1.2772190},
journal = {Applied Physics Letters},
number = 7,
volume = 91,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}