Sense Determination of Micropipes via Grazing-Incidence Synchrotron White Beam X-ray Topography in 4H Silicon Carbide

Journal Article · Mon Jan 01 00:00:00 EST 2007 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2772190· OSTI ID:930525

Chen, Y; Dhanaraj, G; Dudley, M; Sanchez, E; MacMillan, M

Computer modeling using the ray-tracing method has been used to simulate the grazing-incidence x-ray topographic images of micropipes in 4H silicon carbide recorded using the pyramidal (11-28) reflection. Simulation results indicate that the images of micropipes appear as white features of roughly elliptical shape, canted to one side or other of the g vector depending on the dislocation sense. Observed images compare well with the simulations, demonstrating that the direction of cant provides a simple, nondestructive, and reliable way to reveal the senses of micropipes. Sense assignment has been validated using back-reflection reticulography.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 930525
• Report Number(s): BNL-80550-2008-JA; APPLAB; TRN: US0901407
• Journal Information: Applied Physics Letters, Vol. 91, Issue 7; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
COMPUTERIZED SIMULATION
DISLOCATIONS
GRAZING INCIDENCE TOMOGRAPHY
REFLECTION
SHAPE
SILICON CARBIDES
SYNCHROTRON RADIATION
TOPOGRAPHY
VECTORS
X-RAY DIFFRACTION
national synchrotron light source