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Title: Spectroscopic Determination of Phase in Tetragonally Strained Ba0.5Sr0.5TiO3 Films at Room Temperature

Abstract

Sputter-deposited Ba{sub 0.5}Sr{sub 0.5}TiO{sub 3} thin films on MgO(001) substrates with either in-plane (c<a) or out-of-plane (c>a) tetragonal lattice structure distortions were characterized by polarization-dependent Ti K-edge x-ray absorption fine-structure (XAFS) spectroscopy and microwave dielectric measurements. Anisotropy between the in-plane and out-of-plane directions in the films as determined by XAFS provided evidence of spontaneous polarization, and the anisotropy varied with the type of structural distortion. These results explain microwave measurements in which the dielectric properties were significantly affected by lattice distortions and exhibited hysteresis in the in-plane dielectric constant with dc bias at room temperature, suggesting the presence of permanent dipoles.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
930524
Report Number(s):
BNL-80549-2008-JA
Journal ID: ISSN 0003-6951; APPLAB; TRN: US200904%%767
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 91
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; AMBIENT TEMPERATURE; ANISOTROPY; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIPOLES; FINE STRUCTURE; HYSTERESIS; PERMITTIVITY; POLARIZATION; SPECTROSCOPY; SUBSTRATES; TETRAGONAL LATTICES; THIN FILMS; X-RAY SPECTROSCOPY; national synchrotron light source

Citation Formats

Alldredge,L., Woicik, J., Chang, W., Kirchoefer, S., and Pond, J. Spectroscopic Determination of Phase in Tetragonally Strained Ba0.5Sr0.5TiO3 Films at Room Temperature. United States: N. p., 2007. Web. doi:10.1063/1.2766668.
Alldredge,L., Woicik, J., Chang, W., Kirchoefer, S., & Pond, J. Spectroscopic Determination of Phase in Tetragonally Strained Ba0.5Sr0.5TiO3 Films at Room Temperature. United States. doi:10.1063/1.2766668.
Alldredge,L., Woicik, J., Chang, W., Kirchoefer, S., and Pond, J. Mon . "Spectroscopic Determination of Phase in Tetragonally Strained Ba0.5Sr0.5TiO3 Films at Room Temperature". United States. doi:10.1063/1.2766668.
@article{osti_930524,
title = {Spectroscopic Determination of Phase in Tetragonally Strained Ba0.5Sr0.5TiO3 Films at Room Temperature},
author = {Alldredge,L. and Woicik, J. and Chang, W. and Kirchoefer, S. and Pond, J.},
abstractNote = {Sputter-deposited Ba{sub 0.5}Sr{sub 0.5}TiO{sub 3} thin films on MgO(001) substrates with either in-plane (c<a) or out-of-plane (c>a) tetragonal lattice structure distortions were characterized by polarization-dependent Ti K-edge x-ray absorption fine-structure (XAFS) spectroscopy and microwave dielectric measurements. Anisotropy between the in-plane and out-of-plane directions in the films as determined by XAFS provided evidence of spontaneous polarization, and the anisotropy varied with the type of structural distortion. These results explain microwave measurements in which the dielectric properties were significantly affected by lattice distortions and exhibited hysteresis in the in-plane dielectric constant with dc bias at room temperature, suggesting the presence of permanent dipoles.},
doi = {10.1063/1.2766668},
journal = {Applied Physics Letters},
number = ,
volume = 91,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}