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Title: Synchrotron X-ray Based Characterization of CdZnTe Crystals

Abstract

Synthetic CdZnTe (CZT) crystals can be used for the room temperature-based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
930039
Report Number(s):
BNL-80660-2008-JA
Journal ID: ISSN 0361-5235; JECMA5; TRN: US0806692
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Electronic Materials; Journal Volume: 36; Journal Issue: 8
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION SPECTROSCOPY; CRYSTALS; DETECTION; FINE STRUCTURE; GAMMA RADIATION; INCLUSIONS; INFRARED THERMOGRAPHY; LEVELS; MATERIALS; PERFORMANCE; RADIATION DETECTORS; SPECTROSCOPY; SYNCHROTRONS; X-RAY DIFFRACTION; national synchrotron light source

Citation Formats

Duff,M., Hunter, D., Nuessle, P., Black, D., Burdette, H., Woicik, J., Burger, A., and Groza, M. Synchrotron X-ray Based Characterization of CdZnTe Crystals. United States: N. p., 2007. Web. doi:10.1007/s11664-007-0181-x.
Duff,M., Hunter, D., Nuessle, P., Black, D., Burdette, H., Woicik, J., Burger, A., & Groza, M. Synchrotron X-ray Based Characterization of CdZnTe Crystals. United States. doi:10.1007/s11664-007-0181-x.
Duff,M., Hunter, D., Nuessle, P., Black, D., Burdette, H., Woicik, J., Burger, A., and Groza, M. Mon . "Synchrotron X-ray Based Characterization of CdZnTe Crystals". United States. doi:10.1007/s11664-007-0181-x.
@article{osti_930039,
title = {Synchrotron X-ray Based Characterization of CdZnTe Crystals},
author = {Duff,M. and Hunter, D. and Nuessle, P. and Black, D. and Burdette, H. and Woicik, J. and Burger, A. and Groza, M.},
abstractNote = {Synthetic CdZnTe (CZT) crystals can be used for the room temperature-based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.},
doi = {10.1007/s11664-007-0181-x},
journal = {Journal of Electronic Materials},
number = 8,
volume = 36,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}