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Title: Nanoscale Observation of Delayering in Alkane Films

Abstract

Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane (n-C{sub 32}H{sub 66} or C32) films adsorbed on SiO{sub 2}-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point T{sub b} in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above T{sub b} and to a solid 3D phase on cooling below T{sub b}. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
929963
Report Number(s):
BNL-80567-2008-JA
Journal ID: ISSN 0295-5075; EULEEJ; TRN: US0806674
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Europhysics Letters; Journal Volume: 79
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ALKANES; ATOMIC FORCE MICROSCOPY; COOLING; EQUILIBRIUM; FILMS; FLUIDS; HEATING; MELTING POINTS; MOLECULES; PHASE DIAGRAMS; SCATTERING; SOLIDS; SYNCHROTRON RADIATION; TEMPERATURE RANGE; X-RAY DIFFRACTION; national synchrotron light source

Citation Formats

Bai,M., Knorr, K., Simpson, M., Trogisch, S., Taub, H., Ehrlich, S., Mo, H., Volkmann, U., and Hansen, F.. Nanoscale Observation of Delayering in Alkane Films. United States: N. p., 2007. Web. doi:10.1209/0295-5075/79/26003.
Bai,M., Knorr, K., Simpson, M., Trogisch, S., Taub, H., Ehrlich, S., Mo, H., Volkmann, U., & Hansen, F.. Nanoscale Observation of Delayering in Alkane Films. United States. doi:10.1209/0295-5075/79/26003.
Bai,M., Knorr, K., Simpson, M., Trogisch, S., Taub, H., Ehrlich, S., Mo, H., Volkmann, U., and Hansen, F.. Mon . "Nanoscale Observation of Delayering in Alkane Films". United States. doi:10.1209/0295-5075/79/26003.
@article{osti_929963,
title = {Nanoscale Observation of Delayering in Alkane Films},
author = {Bai,M. and Knorr, K. and Simpson, M. and Trogisch, S. and Taub, H. and Ehrlich, S. and Mo, H. and Volkmann, U. and Hansen, F.},
abstractNote = {Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane (n-C{sub 32}H{sub 66} or C32) films adsorbed on SiO{sub 2}-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point T{sub b} in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above T{sub b} and to a solid 3D phase on cooling below T{sub b}. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.},
doi = {10.1209/0295-5075/79/26003},
journal = {Europhysics Letters},
number = ,
volume = 79,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}