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Title: EUV multilayer coatings for the Atmospheric Imaging Assembly instrument aboard the Solar Dynamics Observatory

Abstract

Multilayer coatings for the 7 EUV channels of the AIA have been developed and completed successfully on all AIA flight mirrors. Mo/Si coatings (131, 171, 193.5, 211 {angstrom}) were deposited at Lawrence Livermore National Laboratory (LLNL). Mg/SiC (304, 335 {angstrom}) and Mo/Y (94 {angstrom}) coatings were deposited at Columbia University. EUV reflectance of the 131/335 {angstrom}, 171 {angstrom}, 193.5/211 {angstrom} primary and secondary flight mirrors and the 94/304 {angstrom} secondary flight mirror was measured at beamline 6.3.2. of the Advanced Light Source (ALS) at LBNL. EUV reflectance of the 94/304 {angstrom} primary and secondary flight mirrors was measured at beamline X24C of the National Synchrotron Light Source (NSLS) at Brookhaven National Lab. Preliminary EUV reflectance measurements of the 94, 304 and 335 {angstrom} coatings were performed with a laser plasma source reflectometer located at Columbia University. Prior to multilayer coating, Atomic Force Microscopy (AFM) characterization and cleaning of all flight substrates was performed at LLNL.

Authors:
; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
928182
Report Number(s):
UCRL-PROC-218841
TRN: US0804237
DOE Contract Number:
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Conference: Presented at: 8th International Conference on the Physics of X-ray Multilayer Structures, Sapporo, Japan, Mar 12 - Mar 16, 2006
Country of Publication:
United States
Language:
English
Subject:
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; 36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUMM MECHANICS, GENERAL PHYSICS; ADVANCED LIGHT SOURCE; ATOMIC FORCE MICROSCOPY; CLEANING; COATINGS; LASERS; LAWRENCE LIVERMORE NATIONAL LABORATORY; MIRRORS; NSLS; PHYSICS; PLASMA; SUBSTRATES

Citation Formats

Soufli, R, Windt, D L, Robinson, J C, Baker, S L, Spiller, E, Dollar, F J, Aquila, A L, Gullikson, E M, Kjonrattanawanich, B, Seely, J F, and Golub, L. EUV multilayer coatings for the Atmospheric Imaging Assembly instrument aboard the Solar Dynamics Observatory. United States: N. p., 2006. Web.
Soufli, R, Windt, D L, Robinson, J C, Baker, S L, Spiller, E, Dollar, F J, Aquila, A L, Gullikson, E M, Kjonrattanawanich, B, Seely, J F, & Golub, L. EUV multilayer coatings for the Atmospheric Imaging Assembly instrument aboard the Solar Dynamics Observatory. United States.
Soufli, R, Windt, D L, Robinson, J C, Baker, S L, Spiller, E, Dollar, F J, Aquila, A L, Gullikson, E M, Kjonrattanawanich, B, Seely, J F, and Golub, L. Thu . "EUV multilayer coatings for the Atmospheric Imaging Assembly instrument aboard the Solar Dynamics Observatory". United States. doi:. https://www.osti.gov/servlets/purl/928182.
@article{osti_928182,
title = {EUV multilayer coatings for the Atmospheric Imaging Assembly instrument aboard the Solar Dynamics Observatory},
author = {Soufli, R and Windt, D L and Robinson, J C and Baker, S L and Spiller, E and Dollar, F J and Aquila, A L and Gullikson, E M and Kjonrattanawanich, B and Seely, J F and Golub, L},
abstractNote = {Multilayer coatings for the 7 EUV channels of the AIA have been developed and completed successfully on all AIA flight mirrors. Mo/Si coatings (131, 171, 193.5, 211 {angstrom}) were deposited at Lawrence Livermore National Laboratory (LLNL). Mg/SiC (304, 335 {angstrom}) and Mo/Y (94 {angstrom}) coatings were deposited at Columbia University. EUV reflectance of the 131/335 {angstrom}, 171 {angstrom}, 193.5/211 {angstrom} primary and secondary flight mirrors and the 94/304 {angstrom} secondary flight mirror was measured at beamline 6.3.2. of the Advanced Light Source (ALS) at LBNL. EUV reflectance of the 94/304 {angstrom} primary and secondary flight mirrors was measured at beamline X24C of the National Synchrotron Light Source (NSLS) at Brookhaven National Lab. Preliminary EUV reflectance measurements of the 94, 304 and 335 {angstrom} coatings were performed with a laser plasma source reflectometer located at Columbia University. Prior to multilayer coating, Atomic Force Microscopy (AFM) characterization and cleaning of all flight substrates was performed at LLNL.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Feb 09 00:00:00 EST 2006},
month = {Thu Feb 09 00:00:00 EST 2006}
}

Conference:
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