skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Automated diffraction analysis and spot searching forhigh-throughput crystal screening

Abstract

No abstract prepared.

Authors:
; ; ; ;
Publication Date:
Research Org.:
COLLABORATION - Stanford Synchrotron RadiationLaboratory
OSTI Identifier:
927186
Report Number(s):
LBNL-60815
Journal ID: ISSN 0021-8898; JACGAR; R&D Project: 864D6D; TRN: US200810%%160
DOE Contract Number:  
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Crystallography; Journal Volume: 39; Journal Issue: 1; Related Information: Journal Publication Date: February2006
Country of Publication:
United States
Language:
English
Subject:
59; 47; X-RAY DIFFRACTION; AUTOMATION; CRYSTAL STRUCTURE; crystallography X-ray diffraction

Citation Formats

Zhang, Zepu, Sauter, Nicholas K., van den Bedem, Henry, Snell,Gyorgy, and Deacon, Ashley M. Automated diffraction analysis and spot searching forhigh-throughput crystal screening. United States: N. p., 2005. Web.
Zhang, Zepu, Sauter, Nicholas K., van den Bedem, Henry, Snell,Gyorgy, & Deacon, Ashley M. Automated diffraction analysis and spot searching forhigh-throughput crystal screening. United States.
Zhang, Zepu, Sauter, Nicholas K., van den Bedem, Henry, Snell,Gyorgy, and Deacon, Ashley M. Thu . "Automated diffraction analysis and spot searching forhigh-throughput crystal screening". United States. doi:.
@article{osti_927186,
title = {Automated diffraction analysis and spot searching forhigh-throughput crystal screening},
author = {Zhang, Zepu and Sauter, Nicholas K. and van den Bedem, Henry and Snell,Gyorgy and Deacon, Ashley M.},
abstractNote = {No abstract prepared.},
doi = {},
journal = {Journal of Applied Crystallography},
number = 1,
volume = 39,
place = {United States},
year = {Thu Dec 08 00:00:00 EST 2005},
month = {Thu Dec 08 00:00:00 EST 2005}
}