Data processing device test apparatus and method therefor

Patent · 08 April 2003

OSTI ID:921440

Wilcox, Richard Jacob ^[1]; Mulig, Jason D ^[1]; Eppes, David ^[1]; Bruce, Michael R ^[1]; Bruce, Victoria J ^[1]; Ring, Rosalinda M ^[1]; Tangyunyong, Paiboon ^[2]; Hawkins, Charles F ^[2]; Louie, Arnold Y ^[3]

---

1. Austin, TX
2. Bernalillo, NM
3. Santa Clara, CA

A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.

• Research Organization: Sandia Corporation
• Sponsoring Organization: United States Department of Energy
• DOE Contract Number: AC04-94AL85000
• Assignee: Advanced Micro Devices (Austin, TX)
• Patent Number(s): 6,546,513
• Application Number: 09/586,572
• OSTI ID: 921440
• Country of Publication: United States
• Language: English