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Title: Spin microscope based on optically detected magnetic resonance

Abstract

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Inventors:
 [1];  [1]
  1. (Los Alamos, NM)
Publication Date:
Research Org.:
United States Department of Energy
Sponsoring Org.:
USDOE
OSTI Identifier:
921033
Patent Number(s):
7,305,869
Application Number:
11/102,626
Assignee:
United States Department of Energy U. S. Department of Energy (Washington, DC) ALO
DOE Contract Number:
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Berman, Gennady P., and Chernobrod, Boris M.. Spin microscope based on optically detected magnetic resonance. United States: N. p., 2007. Web.
Berman, Gennady P., & Chernobrod, Boris M.. Spin microscope based on optically detected magnetic resonance. United States.
Berman, Gennady P., and Chernobrod, Boris M.. Tue . "Spin microscope based on optically detected magnetic resonance". United States. doi:. https://www.osti.gov/servlets/purl/921033.
@article{osti_921033,
title = {Spin microscope based on optically detected magnetic resonance},
author = {Berman, Gennady P. and Chernobrod, Boris M.},
abstractNote = {The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 11 00:00:00 EST 2007},
month = {Tue Dec 11 00:00:00 EST 2007}
}

Patent:

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