Pb Quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS

Conference · Sat Apr 07 00:00:00 EDT 2007

DOI:https://doi.org/10.1016/j.nima.2007.04.018· OSTI ID:919305

Bliss, Mary ^[1]; Gerlach, David C. ^[1]; Cliff, John B. ^[1]; Toloczko, Mychailo B. ^[1]; Barnett, Debra S. ^[1]; Ciampi, Guido ^[2]; Jones, Kelly A. ^[2]; Lynn, Kelvin G. ^[2]

---

1. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
2. Washington State Univ., Pullman, WA (United States)

High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the CZT. Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atom %) was characterized to determine the distribution of lead and its potential impact on precipitates.

• Research Organization: Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 919305
• Report Number(s): PNNL-SA-50517; TRN: US200822%%22
• Resource Relation: Conference: Proceedings of the 11th Symposium on Radiation Measurements and Applications, Ann Arbor, MI (United States), 23-25 May 2006; Related Information: published in Nuclear Instruments and Methods in Physics Research, Part A, 579(1):138-140
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CADMIUM TELLURIDES
ZINC TELLURIDES
BRIDGMAN METHOD
TRACE AMOUNTS
LEAD
DOPED MATERIALS