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Title: High resolution trace element and isotopic imaging of microbial systems by NanoSIMS

Abstract

The NanoSIMS 50 is the state of the art in high spatial resolution secondary ion mass spectrometry (SIMS), combining unprecedented spatial resolution (as good as 50 nm) with ultra-high sensitivity (minimum detection limit of {approx}200 atoms). The NanoSIMS has an array of detectors, enabling simultaneous collection of 5 species originating from the same sputtered volume of a sample. The primary ion beam (Cs{sup +} or O{sup -}) can be scanned across the sample to produce quantitative secondary ion images. This capability provides a novel new approach to the study of microbial systems. We have applied our NanoSIMS to various microbial systems. We have analyzed sub-regions of bacterial cells, biofilms, and other associated materials to map trace element and isotopic ratios on a submicron scale. Growth and metabolism have been tracked using stable isotope labels. High resolution SIMS is particularly powerful when used in combination with other high resolution techniques, such as FIB and TEM. Examples will be presented to demonstrate the range of capabilities of this technique for microbial systems.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
917903
Report Number(s):
UCRL-CONF-215311
TRN: US200817%%1011
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Conference: Presented at: AGU Fall Meeting 2005, San Francisco, CA, United States, Dec 05 - Dec 09, 2005
Country of Publication:
United States
Language:
English
Subject:
58 GEOSCIENCES; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 59 BASIC BIOLOGICAL SCIENCES; 54 ENVIRONMENTAL SCIENCES; ELEMENTS; ION BEAMS; MASS SPECTROSCOPY; METABOLISM; RESOLUTION; SENSITIVITY; SPATIAL RESOLUTION; STABLE ISOTOPES; TRACE AMOUNTS

Citation Formats

Weber, P K, Fallon, S J, Pett-Ridge, J, Ghosal, S, Ramon, C E, and Hutcheon, I D. High resolution trace element and isotopic imaging of microbial systems by NanoSIMS. United States: N. p., 2005. Web.
Weber, P K, Fallon, S J, Pett-Ridge, J, Ghosal, S, Ramon, C E, & Hutcheon, I D. High resolution trace element and isotopic imaging of microbial systems by NanoSIMS. United States.
Weber, P K, Fallon, S J, Pett-Ridge, J, Ghosal, S, Ramon, C E, and Hutcheon, I D. Thu . "High resolution trace element and isotopic imaging of microbial systems by NanoSIMS". United States. https://www.osti.gov/servlets/purl/917903.
@article{osti_917903,
title = {High resolution trace element and isotopic imaging of microbial systems by NanoSIMS},
author = {Weber, P K and Fallon, S J and Pett-Ridge, J and Ghosal, S and Ramon, C E and Hutcheon, I D},
abstractNote = {The NanoSIMS 50 is the state of the art in high spatial resolution secondary ion mass spectrometry (SIMS), combining unprecedented spatial resolution (as good as 50 nm) with ultra-high sensitivity (minimum detection limit of {approx}200 atoms). The NanoSIMS has an array of detectors, enabling simultaneous collection of 5 species originating from the same sputtered volume of a sample. The primary ion beam (Cs{sup +} or O{sup -}) can be scanned across the sample to produce quantitative secondary ion images. This capability provides a novel new approach to the study of microbial systems. We have applied our NanoSIMS to various microbial systems. We have analyzed sub-regions of bacterial cells, biofilms, and other associated materials to map trace element and isotopic ratios on a submicron scale. Growth and metabolism have been tracked using stable isotope labels. High resolution SIMS is particularly powerful when used in combination with other high resolution techniques, such as FIB and TEM. Examples will be presented to demonstrate the range of capabilities of this technique for microbial systems.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2005},
month = {9}
}

Conference:
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