skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Understanding the dynamic performance of microchannel plates in pulsed mode

Abstract

The dynamic performance of a microchannel plate (MCP) is highly dependent on the high-voltage waveforms that are applied to it. Impedance mismatches in MCP detectors can significantly vary the waveforms on the MCP compared to the input pulses. High-voltage pulse waveforms launched onto surface coatings on the MCPs have historically been difficult and expensive to measure. Over the past few years, we have developed and tested techniques utilizing probes to measure the voltage propagation on the surface of MCPs. Square and Gaussian pulses with widths ranging from 200 ps to 2 ns have been applied. We have investigated the effects of coating thickness, microstrip width, and openended versus terminated strips. These data provide a wealth of knowledge that is enabling a better understanding of images recorded with these devices. This presentation discusses a method for measuring voltage profiles on the surface of the MCP and presents Monte Carlo simulations of the optical gate profiles based on the measured waveforms. Excellent agreement in the optical gate profiles have been achieved between the simulations and the experimental measurements using a short-pulse ultraviolet laser.

Authors:
 [1];  [1];  [1];  [1];  [2]
  1. NSTec
  2. Sandia National Laboratories
Publication Date:
Research Org.:
National Security Technologies, LLC
Sponsoring Org.:
USDOE - National Nuclear Security Administration (NNSA)
OSTI Identifier:
917721
Report Number(s):
DOE/NV/25946-166
TRN: US0805102
DOE Contract Number:  
DE-AC52-06NA25946
Resource Type:
Conference
Resource Relation:
Conference: 2007 IEEE Pulsed Power and Plasma Science Conference, Albuquerque, NM, June 17-22, 2007
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; IMPEDANCE; PERFORMANCE; PLASMA; PLATES; PROBES; SURFACE COATING; THICKNESS; WAVE FORMS; microchannel plate; impedance; matching; surface probing

Citation Formats

Thomas, Ray, Wu, Ming, Joseph, Nathan, Kruschwitz, Craig, and Rochau, Gregroy A. Understanding the dynamic performance of microchannel plates in pulsed mode. United States: N. p., 2007. Web.
Thomas, Ray, Wu, Ming, Joseph, Nathan, Kruschwitz, Craig, & Rochau, Gregroy A. Understanding the dynamic performance of microchannel plates in pulsed mode. United States.
Thomas, Ray, Wu, Ming, Joseph, Nathan, Kruschwitz, Craig, and Rochau, Gregroy A. Fri . "Understanding the dynamic performance of microchannel plates in pulsed mode". United States. https://www.osti.gov/servlets/purl/917721.
@article{osti_917721,
title = {Understanding the dynamic performance of microchannel plates in pulsed mode},
author = {Thomas, Ray and Wu, Ming and Joseph, Nathan and Kruschwitz, Craig and Rochau, Gregroy A},
abstractNote = {The dynamic performance of a microchannel plate (MCP) is highly dependent on the high-voltage waveforms that are applied to it. Impedance mismatches in MCP detectors can significantly vary the waveforms on the MCP compared to the input pulses. High-voltage pulse waveforms launched onto surface coatings on the MCPs have historically been difficult and expensive to measure. Over the past few years, we have developed and tested techniques utilizing probes to measure the voltage propagation on the surface of MCPs. Square and Gaussian pulses with widths ranging from 200 ps to 2 ns have been applied. We have investigated the effects of coating thickness, microstrip width, and openended versus terminated strips. These data provide a wealth of knowledge that is enabling a better understanding of images recorded with these devices. This presentation discusses a method for measuring voltage profiles on the surface of the MCP and presents Monte Carlo simulations of the optical gate profiles based on the measured waveforms. Excellent agreement in the optical gate profiles have been achieved between the simulations and the experimental measurements using a short-pulse ultraviolet laser.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2007},
month = {6}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: