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Title: Synchrotron-based Imaging and tomography with hard X-rays.

Abstract

Hard X-ray imaging with synchrotron radiation is a powerful tool to study opaque materials on the micro- and nano-lengthscales. Different imaging methods are available with an instrument recently built at Sector 34 of the Advanced Photon Source. In-line phase contrast imaging is performed with micrometer resolution. Increased spatial resolution is achieved using cone-beam geometry. The almost parallel beam is focused with a Kirkpatrick-Baez mirror system. The focal spot serves as a diverging secondary source. An X-ray magnified image of the sample is projected on the detector. For imaging and tomography with sub-100 nm resolution, an X-ray full-field microscope has been built. It uses a Kirkpatrick-Baez mirror (KB) as a condenser optic, followed by a micro-Fresnel zone plate (FZP) as an objective lens. The zone plates presently provide 50-85 nm spatial resolution when operating the microscope with photon energy between 6 and 12 keV. Tomography experiments have been performed with this new device.

Authors:
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Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); National Science Foundation (NSF); National Institute of Standards and Technology (NIST)
OSTI Identifier:
917243
Report Number(s):
ANL/XSD/JA-60069
Journal ID: ISSN 0168-583X; NIMBEU; TRN: US0804490
DOE Contract Number:
DE-AC02-06CH11357
Resource Type:
Journal Article
Resource Relation:
Journal Name: Nucl. Instrum. Methods Phys. Res. B; Journal Volume: 261; Journal Issue: Mar. 28, 2007
Country of Publication:
United States
Language:
ENGLISH
Subject:
43 PARTICLE ACCELERATORS; ADVANCED PHOTON SOURCE; GEOMETRY; MICROSCOPES; MIRRORS; PHOTONS; PLATES; RESOLUTION; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; TOMOGRAPHY

Citation Formats

Rau, C., Crecea, V., Liu, W., Richter, C. P., Peterson, K. M., Jemian, P. R., Neuhausler, U., Schneider, G., Yu, X., Braun, P. V., Chiang, T. C., Robinson, I. K., X-Ray Science Division, Univ. of Illinois, Purdue Univ., Northwestern Univ., Univ. Bielefeld, Univ. Coll. London, Bessy GmbH, and NIST. Synchrotron-based Imaging and tomography with hard X-rays.. United States: N. p., 2007. Web. doi:10.1016/j.nimb.2007.03.053.
Rau, C., Crecea, V., Liu, W., Richter, C. P., Peterson, K. M., Jemian, P. R., Neuhausler, U., Schneider, G., Yu, X., Braun, P. V., Chiang, T. C., Robinson, I. K., X-Ray Science Division, Univ. of Illinois, Purdue Univ., Northwestern Univ., Univ. Bielefeld, Univ. Coll. London, Bessy GmbH, & NIST. Synchrotron-based Imaging and tomography with hard X-rays.. United States. doi:10.1016/j.nimb.2007.03.053.
Rau, C., Crecea, V., Liu, W., Richter, C. P., Peterson, K. M., Jemian, P. R., Neuhausler, U., Schneider, G., Yu, X., Braun, P. V., Chiang, T. C., Robinson, I. K., X-Ray Science Division, Univ. of Illinois, Purdue Univ., Northwestern Univ., Univ. Bielefeld, Univ. Coll. London, Bessy GmbH, and NIST. Wed . "Synchrotron-based Imaging and tomography with hard X-rays.". United States. doi:10.1016/j.nimb.2007.03.053.
@article{osti_917243,
title = {Synchrotron-based Imaging and tomography with hard X-rays.},
author = {Rau, C. and Crecea, V. and Liu, W. and Richter, C. P. and Peterson, K. M. and Jemian, P. R. and Neuhausler, U. and Schneider, G. and Yu, X. and Braun, P. V. and Chiang, T. C. and Robinson, I. K. and X-Ray Science Division and Univ. of Illinois and Purdue Univ. and Northwestern Univ. and Univ. Bielefeld and Univ. Coll. London and Bessy GmbH and NIST},
abstractNote = {Hard X-ray imaging with synchrotron radiation is a powerful tool to study opaque materials on the micro- and nano-lengthscales. Different imaging methods are available with an instrument recently built at Sector 34 of the Advanced Photon Source. In-line phase contrast imaging is performed with micrometer resolution. Increased spatial resolution is achieved using cone-beam geometry. The almost parallel beam is focused with a Kirkpatrick-Baez mirror system. The focal spot serves as a diverging secondary source. An X-ray magnified image of the sample is projected on the detector. For imaging and tomography with sub-100 nm resolution, an X-ray full-field microscope has been built. It uses a Kirkpatrick-Baez mirror (KB) as a condenser optic, followed by a micro-Fresnel zone plate (FZP) as an objective lens. The zone plates presently provide 50-85 nm spatial resolution when operating the microscope with photon energy between 6 and 12 keV. Tomography experiments have been performed with this new device.},
doi = {10.1016/j.nimb.2007.03.053},
journal = {Nucl. Instrum. Methods Phys. Res. B},
number = Mar. 28, 2007,
volume = 261,
place = {United States},
year = {Wed Mar 28 00:00:00 EDT 2007},
month = {Wed Mar 28 00:00:00 EDT 2007}
}