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Title: Dynamics of polymer bilayer films.

Abstract

We report grazing incidence coherent X-ray measurements from polymer bilayers consisting of spun-cast layers of Polystyrene (PS) and Poly(4-bromo styrene) (PBrS) supported on silicon wafers. For PS/PBrS/Si bilayers, the films are stable and we are able to probe equilibrium thermal surface height fluctuations using X-ray Photon Correlation Spectroscopy (XPCS). When the layers are inverted to PBrS/PS/Si, the films de-wet. In this geometry we can measure both the non-equilibrium evolution of the film structure using time-resolved surface diffuse X-ray scattering and quasi-equilibrium fluctuations of the de-wetting film using XPCS.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); National Science Foundation (NSF)
OSTI Identifier:
915328
Report Number(s):
ANL/IPNS/JA-57246
Journal ID: ISSN 0022-3093; JNCSBJ; TRN: US0804952
DOE Contract Number:  
DE-AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
J. Non-Cryst. Solids
Additional Journal Information:
Journal Volume: 352; Journal Issue: 42-49 ; Nov. 15, 2006; Journal ID: ISSN 0022-3093
Country of Publication:
United States
Language:
ENGLISH
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; FLUCTUATIONS; GEOMETRY; PHOTONS; POLYMERS; POLYSTYRENE; PROBES; SCATTERING; SILICON; SPECTROSCOPY; STYRENE

Citation Formats

Hu, X., Narayanan, S., Lurio, L. B., Lal, J., and Northern Illinois Univ. Dynamics of polymer bilayer films.. United States: N. p., 2006. Web. doi:10.1016/j.jnoncrysol.2006.02.180.
Hu, X., Narayanan, S., Lurio, L. B., Lal, J., & Northern Illinois Univ. Dynamics of polymer bilayer films.. United States. doi:10.1016/j.jnoncrysol.2006.02.180.
Hu, X., Narayanan, S., Lurio, L. B., Lal, J., and Northern Illinois Univ. Wed . "Dynamics of polymer bilayer films.". United States. doi:10.1016/j.jnoncrysol.2006.02.180.
@article{osti_915328,
title = {Dynamics of polymer bilayer films.},
author = {Hu, X. and Narayanan, S. and Lurio, L. B. and Lal, J. and Northern Illinois Univ.},
abstractNote = {We report grazing incidence coherent X-ray measurements from polymer bilayers consisting of spun-cast layers of Polystyrene (PS) and Poly(4-bromo styrene) (PBrS) supported on silicon wafers. For PS/PBrS/Si bilayers, the films are stable and we are able to probe equilibrium thermal surface height fluctuations using X-ray Photon Correlation Spectroscopy (XPCS). When the layers are inverted to PBrS/PS/Si, the films de-wet. In this geometry we can measure both the non-equilibrium evolution of the film structure using time-resolved surface diffuse X-ray scattering and quasi-equilibrium fluctuations of the de-wetting film using XPCS.},
doi = {10.1016/j.jnoncrysol.2006.02.180},
journal = {J. Non-Cryst. Solids},
issn = {0022-3093},
number = 42-49 ; Nov. 15, 2006,
volume = 352,
place = {United States},
year = {2006},
month = {11}
}