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Title: Phase separation and nanoparticle formation in Cr-dosed FePt thin films.

Abstract

No abstract prepared.

Authors:
; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); OUS
OSTI Identifier:
914821
Report Number(s):
ANL/MSD/JA-57093
Journal ID: ISSN 0021-8979; JAPIAU; TRN: US200812%%87
DOE Contract Number:
DE-AC02-06CH11357
Resource Type:
Journal Article
Resource Relation:
Journal Name: J. Appl. Phys.; Journal Volume: 101; Journal Issue: Mar. 1, 2007
Country of Publication:
United States
Language:
ENGLISH
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; THIN FILMS; IRON ALLOYS; PLATINUM ALLOYS; DOPED MATERIALS; CHROMIUM; NANOSTRUCTURES; PHASE STUDIES

Citation Formats

Won, C., Keavney, D. J., and Bader, S. D.. Phase separation and nanoparticle formation in Cr-dosed FePt thin films.. United States: N. p., 2007. Web. doi:10.1063/1.2436926.
Won, C., Keavney, D. J., & Bader, S. D.. Phase separation and nanoparticle formation in Cr-dosed FePt thin films.. United States. doi:10.1063/1.2436926.
Won, C., Keavney, D. J., and Bader, S. D.. Thu . "Phase separation and nanoparticle formation in Cr-dosed FePt thin films.". United States. doi:10.1063/1.2436926.
@article{osti_914821,
title = {Phase separation and nanoparticle formation in Cr-dosed FePt thin films.},
author = {Won, C. and Keavney, D. J. and Bader, S. D.},
abstractNote = {No abstract prepared.},
doi = {10.1063/1.2436926},
journal = {J. Appl. Phys.},
number = Mar. 1, 2007,
volume = 101,
place = {United States},
year = {Thu Mar 01 00:00:00 EST 2007},
month = {Thu Mar 01 00:00:00 EST 2007}
}
  • Tailored metal alloy thin film-oxide interfaces generated using molecular beam epitaxial (MBE) deposition of alloy thin films on a single crystalline oxide substrate can be used for detailed studies of irradiation damage response on the interface structure. However presence of nanoscale phase separation in the MBE grown alloy thin films can impact the metal-oxide interface structure. Due to nanoscale domain size of such phase separation it is very challenging to characterize by conventional techniques. Therefor laser assisted atom probe tomography (APT) was utilized to study the phase separation in epitaxial Cr 0.61Mo 0.39, Cr 0.77Mo 0.23, and Cr 0.32V 0.68more » alloy thin films grown by MBE on MgO(001) single crystal substrates. Statistical analysis, namely frequency distribution analysis and Pearson coefficient analysis of experimental data was compared with similar analyses conducted on simulated APT datasets with known extent of phase separation. Thus the presence of phase separation in Cr-Mo films, even when phase separation was not clearly observed by x-ray diffraction, and the absence of phase separation in the Cr-V film were thus confirmed.« less
  • Tailored metal alloy thin film-oxide interfaces generated using molecular beam epitaxy (MBE) deposition of alloy thin films on a single crystalline oxide substrate can be used for detailed studies of irradiation damage response on the interface structure. However, the presence of nanoscale phase separation in the MBE grown alloy thin films can impact the metal-oxide interface structure. Due to nanoscale domain size of such phase separation, it is very challenging to characterize by conventional techniques. Therefore, laser assisted atom probe tomography (APT) was utilized to study the phase separation in epitaxial Cr{sub 0.61}Mo{sub 0.39}, Cr{sub 0.77}Mo{sub 0.23}, and Cr{sub 0.32}V{submore » 0.68} alloy thin films grown by MBE on MgO(001) single crystal substrates. Statistical analysis, namely frequency distribution analysis and Pearson coefficient analysis of experimental data was compared with similar analyses conducted on simulated APT datasets with known extent of phase separation. Thus, the presence of phase separation in Cr-Mo films, even when phase separation was not clearly observed by x-ray diffraction, and the absence of phase separation in the Cr-V film were confirmed.« less
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