skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Soft x-ray resonant magnetic scattering from an imprinted magnetic domain pattern

Journal Article · · Appl. Phys. Lett.
DOI:https://doi.org/10.1063/1.2344935· OSTI ID:914379

The authors report on the use of a Co/Pt multilayer, which exhibits strong perpendicular magnetic anisotropy, to magnetostatically imprint a domain pattern onto a 50 Angstroms thick Permalloy layer. Element specific soft x-ray magnetic scattering experiments were then performed so as to be sensitive to the magnetic structure of the Permalloy only. Off-specular magnetic satellite peaks, corresponding to a periodic domain stripe width of 270 nm, were observed, confirmed by magnetic force microscopy and micromagnetic modeling. Thus the authors have exploited the element specificity of soft x-ray scattering to discern the purely magnetic correlations in a structurally flat Permalloy film.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
Sponsoring Organization:
Doe - Office Of Science
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
914379
Report Number(s):
BNL-78947-2007-JA; APPLAB; TRN: US200809%%211
Journal Information:
Appl. Phys. Lett., Vol. 89; ISSN 0003-6951
Country of Publication:
United States
Language:
English