Soft x-ray resonant magnetic scattering from an imprinted magnetic domain pattern
The authors report on the use of a Co/Pt multilayer, which exhibits strong perpendicular magnetic anisotropy, to magnetostatically imprint a domain pattern onto a 50 Angstroms thick Permalloy layer. Element specific soft x-ray magnetic scattering experiments were then performed so as to be sensitive to the magnetic structure of the Permalloy only. Off-specular magnetic satellite peaks, corresponding to a periodic domain stripe width of 270 nm, were observed, confirmed by magnetic force microscopy and micromagnetic modeling. Thus the authors have exploited the element specificity of soft x-ray scattering to discern the purely magnetic correlations in a structurally flat Permalloy film.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 914379
- Report Number(s):
- BNL-78947-2007-JA; APPLAB; TRN: US200809%%211
- Journal Information:
- Appl. Phys. Lett., Vol. 89; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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