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Title: Measurement of Stress/Strain in Single-Crystal Samples using Diffraction

Abstract

Diffraction profiles from an Si-single-crystal strip deformed in cantilever bending are presented as a function of tip displacement and incident-beam energy. Data obtained with slit-based diffracted-beam optics contain a secondary peak in addition to the primary 004 reflection for all energies when the bending strain is finite. This secondary peak can be identified as a 'mirage' peak, predicted by dynamical diffraction theory to occur in weakly deformed single-crystal samples. The integrated intensity of this mirage peak increases with increasing energy and tip displacement and exceeds the primary peak intensity at higher values. The mirage peak disappears when a monochromator is used in the diffracted-beam path. Data that show the effect of these mirage peaks on X-ray diffraction strain analysis are presented, and it is shown that a diffracted-beam monochromator may be used to eliminate these errors.

Authors:
;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
914226
Report Number(s):
BNL-78794-2007-JA
Journal ID: ISSN 0021-8898; JACGAR; TRN: US200809%%2
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: J. Appl. Cryst.; Journal Volume: 39
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; STRAINS; X-RAY DIFFRACTION; STRESSES; MONOCRYSTALS; SILICON; national synchrotron light source

Citation Formats

Yan,H., and Noyan, I. Measurement of Stress/Strain in Single-Crystal Samples using Diffraction. United States: N. p., 2006. Web. doi:10.1107/S0021889806006662.
Yan,H., & Noyan, I. Measurement of Stress/Strain in Single-Crystal Samples using Diffraction. United States. doi:10.1107/S0021889806006662.
Yan,H., and Noyan, I. Sun . "Measurement of Stress/Strain in Single-Crystal Samples using Diffraction". United States. doi:10.1107/S0021889806006662.
@article{osti_914226,
title = {Measurement of Stress/Strain in Single-Crystal Samples using Diffraction},
author = {Yan,H. and Noyan, I.},
abstractNote = {Diffraction profiles from an Si-single-crystal strip deformed in cantilever bending are presented as a function of tip displacement and incident-beam energy. Data obtained with slit-based diffracted-beam optics contain a secondary peak in addition to the primary 004 reflection for all energies when the bending strain is finite. This secondary peak can be identified as a 'mirage' peak, predicted by dynamical diffraction theory to occur in weakly deformed single-crystal samples. The integrated intensity of this mirage peak increases with increasing energy and tip displacement and exceeds the primary peak intensity at higher values. The mirage peak disappears when a monochromator is used in the diffracted-beam path. Data that show the effect of these mirage peaks on X-ray diffraction strain analysis are presented, and it is shown that a diffracted-beam monochromator may be used to eliminate these errors.},
doi = {10.1107/S0021889806006662},
journal = {J. Appl. Cryst.},
number = ,
volume = 39,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}