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Title: Defect Analysis in Crystals using X-ray Topography

Abstract

A brief review of X-ray topography - a nondestructive method for direct observation and characterization of defects in single crystals - is presented here. The origin and development of this characterization method and the different techniques derived from it are described. Emphasis is placed on synchrotron X-ray topography and its application in studying various crystal imperfections. Mechanisms of contrast formation on X-ray topographs are discussed, with emphasis on contrast associated with dislocations. Determination of Burgers vectors and line directions of dislocations from analysis of X-ray topographs is explained. Contrast from inclusions is illustrated, and their differentiation from dislocations is demonstrated with the aid of simulated topographs. Contrast arising from the deformation fields associated with cracks is also briefly covered.

Authors:
; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
914218
Report Number(s):
BNL-78786-2007-JA
TRN: US0801606
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Microsc. Res. Tech.; Journal Volume: 69
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; BURGERS VECTOR; DEFECTS; DEFORMATION; DISLOCATIONS; MONOCRYSTALS; ORIGIN; SYNCHROTRONS; TOPOGRAPHY; CRACKS; national synchrotron light source

Citation Formats

Raghothamachar,B., Dhanaraj, G., Bai, J., and Dudley, M.. Defect Analysis in Crystals using X-ray Topography. United States: N. p., 2006. Web. doi:10.1002/jemt.20290.
Raghothamachar,B., Dhanaraj, G., Bai, J., & Dudley, M.. Defect Analysis in Crystals using X-ray Topography. United States. doi:10.1002/jemt.20290.
Raghothamachar,B., Dhanaraj, G., Bai, J., and Dudley, M.. Sun . "Defect Analysis in Crystals using X-ray Topography". United States. doi:10.1002/jemt.20290.
@article{osti_914218,
title = {Defect Analysis in Crystals using X-ray Topography},
author = {Raghothamachar,B. and Dhanaraj, G. and Bai, J. and Dudley, M.},
abstractNote = {A brief review of X-ray topography - a nondestructive method for direct observation and characterization of defects in single crystals - is presented here. The origin and development of this characterization method and the different techniques derived from it are described. Emphasis is placed on synchrotron X-ray topography and its application in studying various crystal imperfections. Mechanisms of contrast formation on X-ray topographs are discussed, with emphasis on contrast associated with dislocations. Determination of Burgers vectors and line directions of dislocations from analysis of X-ray topographs is explained. Contrast from inclusions is illustrated, and their differentiation from dislocations is demonstrated with the aid of simulated topographs. Contrast arising from the deformation fields associated with cracks is also briefly covered.},
doi = {10.1002/jemt.20290},
journal = {Microsc. Res. Tech.},
number = ,
volume = 69,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}
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