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Title: Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials

Abstract

We have demonstrated near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic structure of carbon nanotubes and related nanomaterials. Specifically, we employ NEXAFS in the study of single-walled carbon nanotube and multi-walled carbon nanotube powders, films, and arrays, as well as of boron nitride nanotubes. We have focused on the advantages of NEXAFS as an exciting, complementary tool to conventional microscopy and spectroscopy for providing chemical and structural information about nanoscale samples.

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
913959
Report Number(s):
BNL-78527-2007-JA
TRN: US0801431
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Journal Name:
Small
Additional Journal Information:
Journal Volume: 2; Journal Issue: 1
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ABSORPTION; BORON NITRIDES; CARBON; CHEMISTRY; ELECTRONIC STRUCTURE; FINE STRUCTURE; MICROSCOPY; NANOTUBES; ORIENTATION; SPECTROSCOPY; NSLS; national synchrotron light source

Citation Formats

Hemraj-Benny,T., Banerjee, S., Sambasivan, S., Balasubramanian, M., Fischer, D., Lowndes, D., Han, W., Misewich, J., Wong, S., and et al. Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials. United States: N. p., 2006. Web. doi:10.1002/smll.200500256.
Hemraj-Benny,T., Banerjee, S., Sambasivan, S., Balasubramanian, M., Fischer, D., Lowndes, D., Han, W., Misewich, J., Wong, S., & et al. Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials. United States. doi:10.1002/smll.200500256.
Hemraj-Benny,T., Banerjee, S., Sambasivan, S., Balasubramanian, M., Fischer, D., Lowndes, D., Han, W., Misewich, J., Wong, S., and et al. Sun . "Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials". United States. doi:10.1002/smll.200500256.
@article{osti_913959,
title = {Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials},
author = {Hemraj-Benny,T. and Banerjee, S. and Sambasivan, S. and Balasubramanian, M. and Fischer, D. and Lowndes, D. and Han, W. and Misewich, J. and Wong, S. and et al.},
abstractNote = {We have demonstrated near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic structure of carbon nanotubes and related nanomaterials. Specifically, we employ NEXAFS in the study of single-walled carbon nanotube and multi-walled carbon nanotube powders, films, and arrays, as well as of boron nitride nanotubes. We have focused on the advantages of NEXAFS as an exciting, complementary tool to conventional microscopy and spectroscopy for providing chemical and structural information about nanoscale samples.},
doi = {10.1002/smll.200500256},
journal = {Small},
number = 1,
volume = 2,
place = {United States},
year = {2006},
month = {1}
}