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Title: Length scale effects on the electronic transport properties ofnanometric Cu/Nb multilayers

Abstract

No abstract prepared.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
COLLABORATION - LANL
OSTI Identifier:
909517
Report Number(s):
LBNL-62632
Journal ID: ISSN 0040-6090; THSFAP; TRN: US200722%%1115
DOE Contract Number:  
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: Thin Solid Films; Journal Volume: 515; Related Information: Journal Publication Date: 2007
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COPPER; NIOBIUM; NANOSTRUCTURES; ELECTRICAL PROPERTIES

Citation Formats

Lima, A.L., Zhang, X., Misra, A., Booth, C.H., Bauer, E.D., and Hundley, M.F.. Length scale effects on the electronic transport properties ofnanometric Cu/Nb multilayers. United States: N. p., 2005. Web.
Lima, A.L., Zhang, X., Misra, A., Booth, C.H., Bauer, E.D., & Hundley, M.F.. Length scale effects on the electronic transport properties ofnanometric Cu/Nb multilayers. United States.
Lima, A.L., Zhang, X., Misra, A., Booth, C.H., Bauer, E.D., and Hundley, M.F.. Tue . "Length scale effects on the electronic transport properties ofnanometric Cu/Nb multilayers". United States. doi:.
@article{osti_909517,
title = {Length scale effects on the electronic transport properties ofnanometric Cu/Nb multilayers},
author = {Lima, A.L. and Zhang, X. and Misra, A. and Booth, C.H. and Bauer, E.D. and Hundley, M.F.},
abstractNote = {No abstract prepared.},
doi = {},
journal = {Thin Solid Films},
number = ,
volume = 515,
place = {United States},
year = {Tue Dec 13 00:00:00 EST 2005},
month = {Tue Dec 13 00:00:00 EST 2005}
}