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Title: Method for non-referential defect characterization using fractal encoding and active contours

Patent ·
OSTI ID:909404

A method for identification of anomalous structures, such as defects, includes the steps of providing a digital image and applying fractal encoding to identify a location of at least one anomalous portion of the image. The method does not require a reference image to identify the location of the anomalous portion. The method can further include the step of initializing an active contour based on the location information obtained from the fractal encoding step and deforming an active contour to enhance the boundary delineation of the anomalous portion.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
Ut-Battelle LLC (Oak Ridge, TN)
Patent Number(s):
7,218,772
Application Number:
10/166,296
OSTI ID:
909404
Country of Publication:
United States
Language:
English

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  • Design, Process Integration, and Characterization for Microelectronics, SPIE Proceedings https://doi.org/10.1117/12.475642
conference July 2002
Higher accuracy and throughput in computer-aided screening of mammographic microcalcifications conference January 1997