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Title: Implementation of a Comprehensive On-Line Closed-Loop Diagnostic System for Roll-to-Roll Amorphous Silicon Solar Cell Production: Final Subcontract Report, 23 April 2003 - 30 September 2006

Abstract

This report summarizes Energy Conversion Devices' diagnostic systems that were developed in this program, as well as ECD's other major accomplishments. This report concentrates on work carried out in the final (third) phase of this program, beginning in the fall of 2004 and ending in the fall of 2006. ECD has developed a comprehensive in-situ diagnostic system that: Reduces the time between deposition in the a-Si machine and device characterization from about 200 h to about 1 h; The Photovoltaic Capacitive Diagnostic systems measure the open-circuit voltage and charging rate (a measure of the short-circuit current) and intra-cell series resistance for each cell in the triple-junction device prior to deposition of the top conductive-oxide coating in a subsequent deposition machine. These systems operate with an rms precision of about 0.03% and have operated for almost 4 years with no need for servicing of the electronics or for calibration; Spectrometers are used to measure the ZnO thickness of the backreflector, a Si thickness, and top conductive-oxide, coatings.

Authors:
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
908019
Report Number(s):
NREL/SR-520-41560
ZDO-0-30628-11; TRN: US200722%%399
DOE Contract Number:  
AC36-99-GO10337
Resource Type:
Technical Report
Resource Relation:
Related Information: Work performed by Energy Conversion Devices, Inc., Troy, Michigan
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; 47 OTHER INSTRUMENTATION; CALIBRATION; COATINGS; DEPOSITION; ENERGY CONVERSION; IMPLEMENTATION; PRODUCTION; SILICON SOLAR CELLS; SPECTROMETERS; THICKNESS; SOLAR ENERGY; DIAGNOSTIC TECHNIQUES; PV; ON-LINE CLOSED-LOOP DIAGNOSTIC SYSTEM; AMORPHOUS SILICON; SOLAR CELLS; PHOTOVOLTAIC CAPACITIVE DIAGNOSTIC (PVCD); OPEN-CIRCUIT VOLTAGE; CHARGING RATE; SHORT-CIRCUIT CURRENT; TOP CONDUCTIVE OXIDE COATING; BACKREFLECTOR; TRIPLE-JUNCTION DEVICE; Solar Energy - Photovoltaics

Citation Formats

Ellison, T. Implementation of a Comprehensive On-Line Closed-Loop Diagnostic System for Roll-to-Roll Amorphous Silicon Solar Cell Production: Final Subcontract Report, 23 April 2003 - 30 September 2006. United States: N. p., 2007. Web. doi:10.2172/908019.
Ellison, T. Implementation of a Comprehensive On-Line Closed-Loop Diagnostic System for Roll-to-Roll Amorphous Silicon Solar Cell Production: Final Subcontract Report, 23 April 2003 - 30 September 2006. United States. doi:10.2172/908019.
Ellison, T. Tue . "Implementation of a Comprehensive On-Line Closed-Loop Diagnostic System for Roll-to-Roll Amorphous Silicon Solar Cell Production: Final Subcontract Report, 23 April 2003 - 30 September 2006". United States. doi:10.2172/908019. https://www.osti.gov/servlets/purl/908019.
@article{osti_908019,
title = {Implementation of a Comprehensive On-Line Closed-Loop Diagnostic System for Roll-to-Roll Amorphous Silicon Solar Cell Production: Final Subcontract Report, 23 April 2003 - 30 September 2006},
author = {Ellison, T.},
abstractNote = {This report summarizes Energy Conversion Devices' diagnostic systems that were developed in this program, as well as ECD's other major accomplishments. This report concentrates on work carried out in the final (third) phase of this program, beginning in the fall of 2004 and ending in the fall of 2006. ECD has developed a comprehensive in-situ diagnostic system that: Reduces the time between deposition in the a-Si machine and device characterization from about 200 h to about 1 h; The Photovoltaic Capacitive Diagnostic systems measure the open-circuit voltage and charging rate (a measure of the short-circuit current) and intra-cell series resistance for each cell in the triple-junction device prior to deposition of the top conductive-oxide coating in a subsequent deposition machine. These systems operate with an rms precision of about 0.03% and have operated for almost 4 years with no need for servicing of the electronics or for calibration; Spectrometers are used to measure the ZnO thickness of the backreflector, a Si thickness, and top conductive-oxide, coatings.},
doi = {10.2172/908019},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 01 00:00:00 EDT 2007},
month = {Tue May 01 00:00:00 EDT 2007}
}

Technical Report:

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