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Title: Method for measuring thermal properties using a long-wavelength infrared thermal image

Patent ·
OSTI ID:902829

A method for estimating the thermal properties of surface materials using long-wavelength thermal imagery by exploiting the differential heating histories of ground points in the vicinity of shadows. The use of differential heating histories of different ground points of the same surface material allows the use of a single image acquisition step to provide the necessary variation in measured parameters for calculation of the thermal properties of surface materials.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation (Albuquerque, MN)
Patent Number(s):
7,171,328
Application Number:
11/215,722
OSTI ID:
902829
Country of Publication:
United States
Language:
English

References (2)

Rapid calculation of terrain parameters for radiation modeling from digital elevation data journal January 1990
Thermal inertia mapping from NOAA-AVHRR data journal January 1998