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Title: Investigating the impact of carbon contamination on RF MEMS reliability.

Abstract

No abstract prepared.

Authors:
;  [1]; ;
  1. (University of New Mexico, Albuquerque, NM)
Publication Date:
Research Org.:
Sandia National Laboratories
Sponsoring Org.:
USDOE
OSTI Identifier:
902576
Report Number(s):
SAND2006-0304C
TRN: US200718%%21
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the IEEE AP-S International Symposium held July 9-14, 2006 in Albuquerque, NM.
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; CARBON; CONTAMINATION; RELIABILITY; MICROELECTRONICS; MINIATURIZATION

Citation Formats

Nordquist, Christopher Daniel, Christodoulou, Christos George, Carton, Andrew James, and Dyck, Christopher William. Investigating the impact of carbon contamination on RF MEMS reliability.. United States: N. p., 2006. Web.
Nordquist, Christopher Daniel, Christodoulou, Christos George, Carton, Andrew James, & Dyck, Christopher William. Investigating the impact of carbon contamination on RF MEMS reliability.. United States.
Nordquist, Christopher Daniel, Christodoulou, Christos George, Carton, Andrew James, and Dyck, Christopher William. Sun . "Investigating the impact of carbon contamination on RF MEMS reliability.". United States. doi:.
@article{osti_902576,
title = {Investigating the impact of carbon contamination on RF MEMS reliability.},
author = {Nordquist, Christopher Daniel and Christodoulou, Christos George and Carton, Andrew James and Dyck, Christopher William},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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