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Title: Defect-related internal dissipation in mechanical resonators and the study of coupled mechanical systems.

Abstract

Understanding internal dissipation in resonant mechanical systems at the micro- and nanoscale is of great technological and fundamental interest. Resonant mechanical systems are central to many sensor technologies, and microscale resonators form the basis of a variety of scanning probe microscopies. Furthermore, coupled resonant mechanical systems are of great utility for the study of complex dynamics in systems ranging from biology to electronics to photonics. In this work, we report the detailed experimental study of internal dissipation in micro- and nanomechanical oscillators fabricated from amorphous and crystalline diamond materials, atomistic modeling of dissipation in amorphous, defect-free, and defect-containing crystalline silicon, and experimental work on the properties of one-dimensional and two-dimensional coupled mechanical oscillator arrays. We have identified that internal dissipation in most micro- and nanoscale oscillators is limited by defect relaxation processes, with large differences in the nature of the defects as the local order of the material ranges from amorphous to crystalline. Atomistic simulations also showed a dominant role of defect relaxation processes in controlling internal dissipation. Our studies of one-dimensional and two-dimensional coupled oscillator arrays revealed that it is possible to create mechanical systems that should be ideal for the study of non-linear dynamics and localization.

Authors:
; ; ; ; ;  [1];  [2]
  1. (Michigan State University, Lansing, MI)
  2. (University of Puerto Rico, Mayaguez, PR)
Publication Date:
Research Org.:
Sandia National Laboratories
Sponsoring Org.:
USDOE
OSTI Identifier:
900851
Report Number(s):
SAND2006-7937
TRN: US200713%%41
DOE Contract Number:
AC04-94AL85000
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; DEFECTS; DIAMONDS; OSCILLATORS; RESONATORS; SILICON; MINIATURIZATION; RELAXATION; Resonators.; Microelectromechanical systems.; Energy dissipation.

Citation Formats

Friedmann, Thomas Aquinas, Czaplewski, David A., Sullivan, John Patrick, Modine, Normand Arthur, Wendt, Joel Robert, Aslam, Dean, and Sepulveda-Alancastro, Nelson. Defect-related internal dissipation in mechanical resonators and the study of coupled mechanical systems.. United States: N. p., 2007. Web. doi:10.2172/900851.
Friedmann, Thomas Aquinas, Czaplewski, David A., Sullivan, John Patrick, Modine, Normand Arthur, Wendt, Joel Robert, Aslam, Dean, & Sepulveda-Alancastro, Nelson. Defect-related internal dissipation in mechanical resonators and the study of coupled mechanical systems.. United States. doi:10.2172/900851.
Friedmann, Thomas Aquinas, Czaplewski, David A., Sullivan, John Patrick, Modine, Normand Arthur, Wendt, Joel Robert, Aslam, Dean, and Sepulveda-Alancastro, Nelson. Mon . "Defect-related internal dissipation in mechanical resonators and the study of coupled mechanical systems.". United States. doi:10.2172/900851. https://www.osti.gov/servlets/purl/900851.
@article{osti_900851,
title = {Defect-related internal dissipation in mechanical resonators and the study of coupled mechanical systems.},
author = {Friedmann, Thomas Aquinas and Czaplewski, David A. and Sullivan, John Patrick and Modine, Normand Arthur and Wendt, Joel Robert and Aslam, Dean and Sepulveda-Alancastro, Nelson},
abstractNote = {Understanding internal dissipation in resonant mechanical systems at the micro- and nanoscale is of great technological and fundamental interest. Resonant mechanical systems are central to many sensor technologies, and microscale resonators form the basis of a variety of scanning probe microscopies. Furthermore, coupled resonant mechanical systems are of great utility for the study of complex dynamics in systems ranging from biology to electronics to photonics. In this work, we report the detailed experimental study of internal dissipation in micro- and nanomechanical oscillators fabricated from amorphous and crystalline diamond materials, atomistic modeling of dissipation in amorphous, defect-free, and defect-containing crystalline silicon, and experimental work on the properties of one-dimensional and two-dimensional coupled mechanical oscillator arrays. We have identified that internal dissipation in most micro- and nanoscale oscillators is limited by defect relaxation processes, with large differences in the nature of the defects as the local order of the material ranges from amorphous to crystalline. Atomistic simulations also showed a dominant role of defect relaxation processes in controlling internal dissipation. Our studies of one-dimensional and two-dimensional coupled oscillator arrays revealed that it is possible to create mechanical systems that should be ideal for the study of non-linear dynamics and localization.},
doi = {10.2172/900851},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2007},
month = {Mon Jan 01 00:00:00 EST 2007}
}

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