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Title: A New Approach for Electron Tomography: Annular Dark-FieldTransmission Electron Microscopy

Abstract

We have demonstrated the applicability of ADF-TEM for tomography. When comparing this technique with BF-TEM tomography it is obvious that both technique scan be complementary: BF-TEM tomography yields information about the morphology, whereas ADF-TEM tomography provides chemical information in the TEM mode, similar to HAADF-STEM tomography, although HAADFSTEM images yield a higher contrast difference for different Z values. Indeed, when ADF-TEM tomography is compared to HAADF-STEM tomography, it is clear that both techniques yield comparable results. It has been noted that the individual projections using ADF-TEM are acquired in TEM mode with exposure times of typically one to three seconds, without the presence of scanning noise. This makes the technique extremely useful in cases where a reduction of the acquisition time is desired; thus reducing beam damage also. Although ADF-TEM was originally developed to avoid the presence of Bragg scattering, the high image contrast obtained suggests that ADF-TEM tomography is not only interesting for materials science but also for biological applications.

Authors:
; ;
Publication Date:
Research Org.:
Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
Sponsoring Org.:
USDOE Director. Office of Science. Office of AdvancedScientific Computing Research. Office of Basic EnergySciences
OSTI Identifier:
899746
Report Number(s):
LBNL-61672
R&D Project: 503601; BnR: KC0201010; TRN: US0702048
DOE Contract Number:
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: Advanced Materials; Journal Volume: 18; Related Information: Journal Publication Date: 2006
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRONS; MORPHOLOGY; SCATTERING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; Annular Dark Field TEM. tomography

Citation Formats

Bals, Sara, Van Tendeloo, Gustaaf, and Kisielowski, Christian. A New Approach for Electron Tomography: Annular Dark-FieldTransmission Electron Microscopy. United States: N. p., 2006. Web. doi:10.1002/adma.200502201.
Bals, Sara, Van Tendeloo, Gustaaf, & Kisielowski, Christian. A New Approach for Electron Tomography: Annular Dark-FieldTransmission Electron Microscopy. United States. doi:10.1002/adma.200502201.
Bals, Sara, Van Tendeloo, Gustaaf, and Kisielowski, Christian. Sun . "A New Approach for Electron Tomography: Annular Dark-FieldTransmission Electron Microscopy". United States. doi:10.1002/adma.200502201.
@article{osti_899746,
title = {A New Approach for Electron Tomography: Annular Dark-FieldTransmission Electron Microscopy},
author = {Bals, Sara and Van Tendeloo, Gustaaf and Kisielowski, Christian},
abstractNote = {We have demonstrated the applicability of ADF-TEM for tomography. When comparing this technique with BF-TEM tomography it is obvious that both technique scan be complementary: BF-TEM tomography yields information about the morphology, whereas ADF-TEM tomography provides chemical information in the TEM mode, similar to HAADF-STEM tomography, although HAADFSTEM images yield a higher contrast difference for different Z values. Indeed, when ADF-TEM tomography is compared to HAADF-STEM tomography, it is clear that both techniques yield comparable results. It has been noted that the individual projections using ADF-TEM are acquired in TEM mode with exposure times of typically one to three seconds, without the presence of scanning noise. This makes the technique extremely useful in cases where a reduction of the acquisition time is desired; thus reducing beam damage also. Although ADF-TEM was originally developed to avoid the presence of Bragg scattering, the high image contrast obtained suggests that ADF-TEM tomography is not only interesting for materials science but also for biological applications.},
doi = {10.1002/adma.200502201},
journal = {Advanced Materials},
number = ,
volume = 18,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}