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Title: Soft X-ray Microscopy of Nanomagnetism

Abstract

Magnetic materials with dimensions of a few tens of nanometers are important for the development of ultrahigh-density magnetic storage and sensor devices. Magnetic microstructure largely determines functionality, and imaging of magnetic domains and magnetization reversal behavior is an outstanding challenge. Magnetic X-ray microscopy makes it possible to investigate magnetization phenomena with elemental specificity and high spatial and temporal resolution.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
Sponsoring Org.:
USDOE Director. Office of Science. Office of AdvancedScientific Computing. Office of Basic Energy Sciences; National ScienceFoundation Research Centre Program, US Departmentof Defense. DefenseAdvanced Research Projects Agency
OSTI Identifier:
899193
Report Number(s):
LBNL-60269
R&D Project: 509201; BnR: KC0202030; TRN: US200706%%919
DOE Contract Number:  
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Today; Journal Volume: 9; Journal Issue: 1-2; Related Information: Journal Publication Date: Jan-Feb 2006
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DIMENSIONS; MAGNETIC MATERIALS; MAGNETIZATION; MICROSCOPY; MICROSTRUCTURE; RESOLUTION; SPECIFICITY; STORAGE

Citation Formats

Fischer, Peter, Kim, Dong-Hyun, Chao, Weilun, Liddle, J.Alexander, Anderson, Erik H., and Attwood, David T. Soft X-ray Microscopy of Nanomagnetism. United States: N. p., 2005. Web.
Fischer, Peter, Kim, Dong-Hyun, Chao, Weilun, Liddle, J.Alexander, Anderson, Erik H., & Attwood, David T. Soft X-ray Microscopy of Nanomagnetism. United States.
Fischer, Peter, Kim, Dong-Hyun, Chao, Weilun, Liddle, J.Alexander, Anderson, Erik H., and Attwood, David T. Fri . "Soft X-ray Microscopy of Nanomagnetism". United States. doi:.
@article{osti_899193,
title = {Soft X-ray Microscopy of Nanomagnetism},
author = {Fischer, Peter and Kim, Dong-Hyun and Chao, Weilun and Liddle, J.Alexander and Anderson, Erik H. and Attwood, David T.},
abstractNote = {Magnetic materials with dimensions of a few tens of nanometers are important for the development of ultrahigh-density magnetic storage and sensor devices. Magnetic microstructure largely determines functionality, and imaging of magnetic domains and magnetization reversal behavior is an outstanding challenge. Magnetic X-ray microscopy makes it possible to investigate magnetization phenomena with elemental specificity and high spatial and temporal resolution.},
doi = {},
journal = {Materials Today},
number = 1-2,
volume = 9,
place = {United States},
year = {Fri Dec 16 00:00:00 EST 2005},
month = {Fri Dec 16 00:00:00 EST 2005}
}