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Title: Soft X-ray Microscopy of Nanomagnetism

Abstract

Magnetic materials with dimensions of a few tens of nanometers are important for the development of ultrahigh-density magnetic storage and sensor devices. Magnetic microstructure largely determines functionality, and imaging of magnetic domains and magnetization reversal behavior is an outstanding challenge. Magnetic X-ray microscopy makes it possible to investigate magnetization phenomena with elemental specificity and high spatial and temporal resolution.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
Sponsoring Org.:
USDOE Director. Office of Science. Office of AdvancedScientific Computing. Office of Basic Energy Sciences; National ScienceFoundation Research Centre Program, US Departmentof Defense. DefenseAdvanced Research Projects Agency
OSTI Identifier:
899193
Report Number(s):
LBNL-60269
R&D Project: 509201; BnR: KC0202030; TRN: US200706%%919
DOE Contract Number:
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Today; Journal Volume: 9; Journal Issue: 1-2; Related Information: Journal Publication Date: Jan-Feb 2006
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DIMENSIONS; MAGNETIC MATERIALS; MAGNETIZATION; MICROSCOPY; MICROSTRUCTURE; RESOLUTION; SPECIFICITY; STORAGE

Citation Formats

Fischer, Peter, Kim, Dong-Hyun, Chao, Weilun, Liddle, J.Alexander, Anderson, Erik H., and Attwood, David T. Soft X-ray Microscopy of Nanomagnetism. United States: N. p., 2005. Web.
Fischer, Peter, Kim, Dong-Hyun, Chao, Weilun, Liddle, J.Alexander, Anderson, Erik H., & Attwood, David T. Soft X-ray Microscopy of Nanomagnetism. United States.
Fischer, Peter, Kim, Dong-Hyun, Chao, Weilun, Liddle, J.Alexander, Anderson, Erik H., and Attwood, David T. Fri . "Soft X-ray Microscopy of Nanomagnetism". United States. doi:.
@article{osti_899193,
title = {Soft X-ray Microscopy of Nanomagnetism},
author = {Fischer, Peter and Kim, Dong-Hyun and Chao, Weilun and Liddle, J.Alexander and Anderson, Erik H. and Attwood, David T.},
abstractNote = {Magnetic materials with dimensions of a few tens of nanometers are important for the development of ultrahigh-density magnetic storage and sensor devices. Magnetic microstructure largely determines functionality, and imaging of magnetic domains and magnetization reversal behavior is an outstanding challenge. Magnetic X-ray microscopy makes it possible to investigate magnetization phenomena with elemental specificity and high spatial and temporal resolution.},
doi = {},
journal = {Materials Today},
number = 1-2,
volume = 9,
place = {United States},
year = {Fri Dec 16 00:00:00 EST 2005},
month = {Fri Dec 16 00:00:00 EST 2005}
}
  • Magnetic soft X-ray microscopy images magnetism in nanoscale systems with a spatial resolution down to 15nm provided by state-of-the-art Fresnel zone plate optics. X-ray magnetic circular dichroism (X-MCD) is used as element-specific magnetic contrast mechanism similar to photoemission electron microscopy (PEEM), however, with volume sensitivity and the ability to record the images in varying applied magnetic fields which allows to study magnetization reversal processes at fundamental length scales. Utilizing a stroboscopic pump-probe scheme one can investigate fast spin dynamics with a time resolution down to 70 ps which gives access to precessional and relaxation phenomena as well as spin torquemore » driven domain wall dynamics in nanoscale systems. Current developments in zone plate optics aim for a spatial resolution towards 10nm and at next generation X-ray sources a time resolution in the fsec regime can be envisioned.« less
  • No abstract prepared.
  • No abstract prepared.
  • The spectroscopic analysis of X-ray magnetic circular dichroism (XMCD), which serves as strong and element-specific magnetic contrast in full-field magnetic transmission soft x-ray microscopy, is shown to provide information on the local distribution of spin (S) and orbital (L) magnetic moments down to a spatial resolution of 25 nm limited by the x-ray optics used in the x-ray microscope. The spatially resolved L/S ratio observed in a multilayered (Co 0.3 nm/Pt 0.5 nm) × 30 thin film exhibiting a strong perpendicular magnetic anisotropy decreases significantly in the vicinity of domain walls, indicating a non-uniform spin configuration in the vertical profile of a domainmore » wall across the thin film. Quantitative XMCD mapping with x-ray spectro-microscopy will become an important characterization tool for systems with topological or engineered magnetization inhomogeneities.« less