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Title: Incident Energy And Polarization-Dependent Resonant Inelastic X-Ray Scattering Study of La2CuO4

Abstract

No abstract prepared.

Authors:
; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Stanford Linear Accelerator Center (SLAC)
Sponsoring Org.:
USDOE
OSTI Identifier:
898874
Report Number(s):
SLAC-REPRINT-2006-205
TRN: US200706%%355
DOE Contract Number:
AC02-76SF00515
Resource Type:
Journal Article
Resource Relation:
Journal Name: Phys.Rev.B74:224509,2006
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; INELASTIC SCATTERING; X-RAY DIFFRACTION; LANTHANUM OXIDES; COPPER OXIDES; Other,OTHER

Citation Formats

Lu, L., Hancock, J.N., Chabot-Couture, G., Ishii, K., Vajk, O.P., Yu, G., Mizuki, J., Casa, D., Gog, T., Greven, M., and /Stanford U., Appl. Phys. Dept. /SLAC, SSRL /NIST, Wash., D.C. /Stanford U., Phys. Dept. /Argonne. Incident Energy And Polarization-Dependent Resonant Inelastic X-Ray Scattering Study of La2CuO4. United States: N. p., 2007. Web.
Lu, L., Hancock, J.N., Chabot-Couture, G., Ishii, K., Vajk, O.P., Yu, G., Mizuki, J., Casa, D., Gog, T., Greven, M., & /Stanford U., Appl. Phys. Dept. /SLAC, SSRL /NIST, Wash., D.C. /Stanford U., Phys. Dept. /Argonne. Incident Energy And Polarization-Dependent Resonant Inelastic X-Ray Scattering Study of La2CuO4. United States.
Lu, L., Hancock, J.N., Chabot-Couture, G., Ishii, K., Vajk, O.P., Yu, G., Mizuki, J., Casa, D., Gog, T., Greven, M., and /Stanford U., Appl. Phys. Dept. /SLAC, SSRL /NIST, Wash., D.C. /Stanford U., Phys. Dept. /Argonne. Fri . "Incident Energy And Polarization-Dependent Resonant Inelastic X-Ray Scattering Study of La2CuO4". United States. doi:.
@article{osti_898874,
title = {Incident Energy And Polarization-Dependent Resonant Inelastic X-Ray Scattering Study of La2CuO4},
author = {Lu, L. and Hancock, J.N. and Chabot-Couture, G. and Ishii, K. and Vajk, O.P. and Yu, G. and Mizuki, J. and Casa, D. and Gog, T. and Greven, M. and /Stanford U., Appl. Phys. Dept. /SLAC, SSRL /NIST, Wash., D.C. /Stanford U., Phys. Dept. /Argonne},
abstractNote = {No abstract prepared.},
doi = {},
journal = {Phys.Rev.B74:224509,2006},
number = ,
volume = ,
place = {United States},
year = {Fri Feb 02 00:00:00 EST 2007},
month = {Fri Feb 02 00:00:00 EST 2007}
}
  • Results of model calculations using exact diagonalization reveal the orbital character of states associated with different Raman loss peaks in Cu K-edge resonant inelastic X-ray scattering (RIXS) from La{sub 2}CuO{sub 4}. The model includes electronic orbitals necessary to highlight non-local Zhang-Rice singlet, charge transfer and d-d excitations, as well as states with apical oxygen 2p{sub z} character. The dispersion of these excitations is discussed with prospects for resonant final state wave-function mapping. A good agreement with experiments emphasizes the substantial multi-orbital character of RIXS profiles in the energy transfer range 1-6 eV.
  • Resonant Inelastic X-ray Scattering (RIXS) in the soft x-ray range is an element-specific energy-loss spectroscopy used to probe the electronic and magnetic excitations in strongly correlated solids. In the recent years, RIXS has been progressing very quickly in terms of energy resolution and understanding of the experimental results, but the interpretation of spectra could further improve, sometimes decisively, from a full knowledge of the polarization of incident and scattered photons. Here we present the first implementation, in a high resolution soft-RIXS spectrometer used to analyze the scattered radiation, of a device allowing the measurement of the degree of linear polarization.more » The system, based on a graded W/B{sub 4}C multilayer mirror installed in proximity of the CCD detector, has been installed on the AXES spectrometer at the ESRF (European Synchrotron Radiation Facility); it has been fully characterized and it has been used for a demonstration experiment at the Cu L{sub 3} edge on a high-T{sub c} superconducting cuprate. The loss in efficiency suffered by the spectrometer equipped with this test facility was a factor 17.5. We propose also a more advanced version, suitable for a routine use on the next generation of RIXS spectrometers and with an overall efficiency up to 10%.« less
  • We use resonant soft x-ray scattering (RSXS) to quantify the hole distribution in a superlattice of insulating La2CuO4 (LCO) and overdoped La2-xSrxCuO4 (LSCO). Despite its nonsuperconducting constituents, this structure is superconducting with Tc=38 K. We found that the conducting holes redistribute electronically from LSCO to the LCO layers. The LCO layers were found to be optimally doped, suggesting they are the main drivers of superconductivity. Our results demonstrate the utility of RSXS for separating electronic from structural effects at oxide interfaces.
  • We use resonant soft x-ray scattering (RSXS) to quantify the hole distribution in a superlattice of insulating La{sub 2}CuO{sub 4} (LCO) and overdoped La{sub 2-x}Sr{sub x}CuO{sub 4} (LSCO). Despite its nonsuperconducting constituents, this structure is superconducting with T{sub c} = 38 K. We found that the conducting holes redistribute electronically from LSCO to the LCO layers. The LCO layers were found to be optimally doped, suggesting they are the main drivers of superconductivity. Our results demonstrate the utility of RSXS for separating electronic from structural effects at oxide interfaces.