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Title: Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy

Abstract

In this study, we describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent illumination) and with a highly collimated intense beam from a synchrotron light source (Kohler illumination).

Authors:
 [1];  [2];  [2];  [3];  [4]
  1. National Institute of Standards and Technology, Gaithersburg, MD (United States)
  2. Purdue Univ., West Lafayette, IN (United States)
  3. J. Pedulla Associates, Silver Springs, MD (United States)
  4. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
898720
Grant/Contract Number:
AC02-06CH11357
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Research of the National Institute of Standards and Technology
Additional Journal Information:
Journal Volume: 111; Journal Issue: 3; Journal ID: ISSN 1044-677X
Publisher:
National Institute of Standards (NIST)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; MICROSCOPY; OPTICS; SYNCHROTRONS; advanced photon source

Citation Formats

Jach, Terrence, Bakulin, Alex S., Durbin, Stephen M., Pedulla, Joseph, and Macrander, Albert. Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy. United States: N. p., 2006. Web. doi:10.6028/jres.111.018.
Jach, Terrence, Bakulin, Alex S., Durbin, Stephen M., Pedulla, Joseph, & Macrander, Albert. Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy. United States. doi:10.6028/jres.111.018.
Jach, Terrence, Bakulin, Alex S., Durbin, Stephen M., Pedulla, Joseph, and Macrander, Albert. Mon . "Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy". United States. doi:10.6028/jres.111.018. https://www.osti.gov/servlets/purl/898720.
@article{osti_898720,
title = {Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy},
author = {Jach, Terrence and Bakulin, Alex S. and Durbin, Stephen M. and Pedulla, Joseph and Macrander, Albert},
abstractNote = {In this study, we describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent illumination) and with a highly collimated intense beam from a synchrotron light source (Kohler illumination).},
doi = {10.6028/jres.111.018},
journal = {Journal of Research of the National Institute of Standards and Technology},
number = 3,
volume = 111,
place = {United States},
year = {Mon May 01 00:00:00 EDT 2006},
month = {Mon May 01 00:00:00 EDT 2006}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 1 work
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