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Title: Detection of Nanocrystallinity By X-Ray Absorption Spectroscopy in Thin Film Transition Metal/Rare-Earth Atom, Elemental And Complex Oxides

Abstract

No abstract prepared.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Stanford Linear Accelerator Center (SLAC)
Sponsoring Org.:
USDOE
OSTI Identifier:
897741
Report Number(s):
SLAC-REPRINT-2006-183
TRN: US200705%%233
DOE Contract Number:
AC02-76SF00515
Resource Type:
Journal Article
Resource Relation:
Journal Name: Radiat.Phys.Chem.75:1608,2006
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; X-RAY SPECTROSCOPY; ABSORPTION SPECTROSCOPY; DETECTION; OXIDES; THIN FILMS; Other,OTHER

Citation Formats

Edge, L.F., Schlom, D.G., Stemmer, S., Lucovsky, G., Luning, J., and /SLAC, SSRL. Detection of Nanocrystallinity By X-Ray Absorption Spectroscopy in Thin Film Transition Metal/Rare-Earth Atom, Elemental And Complex Oxides. United States: N. p., 2007. Web.
Edge, L.F., Schlom, D.G., Stemmer, S., Lucovsky, G., Luning, J., & /SLAC, SSRL. Detection of Nanocrystallinity By X-Ray Absorption Spectroscopy in Thin Film Transition Metal/Rare-Earth Atom, Elemental And Complex Oxides. United States.
Edge, L.F., Schlom, D.G., Stemmer, S., Lucovsky, G., Luning, J., and /SLAC, SSRL. Tue . "Detection of Nanocrystallinity By X-Ray Absorption Spectroscopy in Thin Film Transition Metal/Rare-Earth Atom, Elemental And Complex Oxides". United States. doi:.
@article{osti_897741,
title = {Detection of Nanocrystallinity By X-Ray Absorption Spectroscopy in Thin Film Transition Metal/Rare-Earth Atom, Elemental And Complex Oxides},
author = {Edge, L.F. and Schlom, D.G. and Stemmer, S. and Lucovsky, G. and Luning, J. and /SLAC, SSRL},
abstractNote = {No abstract prepared.},
doi = {},
journal = {Radiat.Phys.Chem.75:1608,2006},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 16 00:00:00 EST 2007},
month = {Tue Jan 16 00:00:00 EST 2007}
}
  • The reactivity of [Cr/Se/Te] multilayers under annealing was investigated using X-ray reflectometry, in situ X-ray diffraction, X-ray absorption fine structure (XAFS) measurements and transmission electron microscopy. For all samples, interdiffusion was complete at temperatures between 100 and 300 deg. C, depending on the repeating tri-layer thickness. A crystalline phase nucleated approximately 20 deg. C above the temperature where interdiffusion was finished. The first crystalline phase in a binary Cr/Te sample was layered CrTe{sub 3} nucleating at 230 deg. C. In ternary samples (Se:Te=0.6-1.2), the low-temperature nucleation of such a layered CrQ {sub 3} (Q=Se, Te) phase is suppressed and insteadmore » the phase Cr{sub 2} Q {sub 3} nucleates first. Interestingly, this phase decomposes around 500 deg. C into layered CrQ {sub 3}. In contrast, binary Cr/Se samples fstable amorphous alloys after interdiffusion and Cr{sub 3}Se{sub 4} nucleates around 500 deg. C as the only crystalline phase. Evaluation of the XAFS data of annealed samples yield Se-Cr distances of 2.568(1) and 2.552(1) A for Cr{sub 2} Q {sub 3} and CrQ {sub 3}, respectively. In the latter sample, higher coordination shells around Se are seen accounting for the Se-Te contacts in the structure. - Graphical abstract: The first step of the reaction of elemental Cr/Te/Se-multilayers is the interdiffusion of the elements as evidenced by the decay of the modulation peaks in the low-angle region of the X-ray diffraction patterns. The subsequent growth of Bragg peaks at higher scattering angles indicates crystallization of chromium chalcogenide Cr{sub 2}Te{sub 3-} {sub x} Se {sub x}.« less
  • No abstract prepared.
  • No abstract prepared.
  • No abstract prepared.