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Title: Structure and properties of Ni/Ti thin films used for brazing.

Abstract

No abstract prepared.

Authors:
 [1]; ; ; ;  [1]
  1. (Colorado School of Mines, Golden, CO)
Publication Date:
Research Org.:
Sandia National Laboratories
Sponsoring Org.:
USDOE
OSTI Identifier:
896866
Report Number(s):
SAND2006-0039C
TRN: US200704%%30
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 3rd International Brazing and Soldering Conference (IBSC) held April 23-26, 2006 in San Antonio, TX.
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; NICKEL; TITANIUM; BRAZING; SOLDERING; THIN FILMS; PHYSICAL PROPERTIES; MORPHOLOGY

Citation Formats

Moore, J.J., Adams, David Price, Rodriguez, Mark Andrew, Brewer, Luke N., and Bai, M. Structure and properties of Ni/Ti thin films used for brazing.. United States: N. p., 2006. Web.
Moore, J.J., Adams, David Price, Rodriguez, Mark Andrew, Brewer, Luke N., & Bai, M. Structure and properties of Ni/Ti thin films used for brazing.. United States.
Moore, J.J., Adams, David Price, Rodriguez, Mark Andrew, Brewer, Luke N., and Bai, M. Sun . "Structure and properties of Ni/Ti thin films used for brazing.". United States. doi:.
@article{osti_896866,
title = {Structure and properties of Ni/Ti thin films used for brazing.},
author = {Moore, J.J. and Adams, David Price and Rodriguez, Mark Andrew and Brewer, Luke N. and Bai, M.},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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