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Title: HIGH SPATIAL-RESOLUTION IMAGING OF TE INCLUSIONS IN CZT MATERIAL.

Abstract

We present new results from our studies of defects in current single-crystal CdZnTe material. Our previous measurements, carried out on thin ({approx}1 mm) and long (>12 mm) CZT detectors, indicated that small (1-20 {micro}m) Te inclusions can significantly degrade the device's energy resolution and detection efficiency. We are conducting detailed studies of the effects of Te inclusions by employing different characterization techniques with better spatial resolution, such as quantitative fluorescence mapping, X-ray micro-diffraction, and TEM. Also, IR microscopy and gamma-mapping with pulse-shape analysis with higher spatial resolution generated more accurate results in the areas surrounding the micro-defects (Te inclusions). Our results reveal how the performance of CdZnTe detectors is influenced by Te inclusions, such as their spatial distribution, concentration, and size. We also discuss a model of charge transport through areas populated with Te inclusions.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
DOE/NNSA
OSTI Identifier:
896445
Report Number(s):
BNL-77075-2006-CP
R&D Project: 10517; NN2001050; TRN: US0700722
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Conference
Resource Relation:
Conference: SPIE, HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS VIII; SAN DIEGO, CA; 20060813 through 20060817
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CADMIUM ALLOYS; ZINC ALLOYS; TELLURIUM ALLOYS; CRYSTAL DEFECTS; DETECTION; INCLUSIONS; ENERGY RESOLUTION; PERFORMANCE; SPATIAL RESOLUTION; SEMICONDUCTOR DETECTORS

Citation Formats

CAMARDA, G S, BOLOTNIKOV, A E, CARINI, G A, CUI, Y, KOHMAN, K T, LI, L, and JAMES, R B. HIGH SPATIAL-RESOLUTION IMAGING OF TE INCLUSIONS IN CZT MATERIAL.. United States: N. p., 2006. Web.
CAMARDA, G S, BOLOTNIKOV, A E, CARINI, G A, CUI, Y, KOHMAN, K T, LI, L, & JAMES, R B. HIGH SPATIAL-RESOLUTION IMAGING OF TE INCLUSIONS IN CZT MATERIAL.. United States.
CAMARDA, G S, BOLOTNIKOV, A E, CARINI, G A, CUI, Y, KOHMAN, K T, LI, L, and JAMES, R B. Sun . "HIGH SPATIAL-RESOLUTION IMAGING OF TE INCLUSIONS IN CZT MATERIAL.". United States. https://www.osti.gov/servlets/purl/896445.
@article{osti_896445,
title = {HIGH SPATIAL-RESOLUTION IMAGING OF TE INCLUSIONS IN CZT MATERIAL.},
author = {CAMARDA, G S and BOLOTNIKOV, A E and CARINI, G A and CUI, Y and KOHMAN, K T and LI, L and JAMES, R B},
abstractNote = {We present new results from our studies of defects in current single-crystal CdZnTe material. Our previous measurements, carried out on thin ({approx}1 mm) and long (>12 mm) CZT detectors, indicated that small (1-20 {micro}m) Te inclusions can significantly degrade the device's energy resolution and detection efficiency. We are conducting detailed studies of the effects of Te inclusions by employing different characterization techniques with better spatial resolution, such as quantitative fluorescence mapping, X-ray micro-diffraction, and TEM. Also, IR microscopy and gamma-mapping with pulse-shape analysis with higher spatial resolution generated more accurate results in the areas surrounding the micro-defects (Te inclusions). Our results reveal how the performance of CdZnTe detectors is influenced by Te inclusions, such as their spatial distribution, concentration, and size. We also discuss a model of charge transport through areas populated with Te inclusions.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2006},
month = {8}
}

Conference:
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