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Title: Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation)

Abstract

The summary of this report is that: in situ SE gives insight into growth mechanisms and accurate layer thickness; (2) ex situ SE measures completed device structures to determine integrated optical properties; and (3) the combination of in situ and ex situ SE provides a powerful method for pinpointing the effects of processing changes in actual SHJ devices and guiding optimization.

Authors:
; ; ; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
894451
Report Number(s):
NREL/PR-520-39986
TRN: US200701%%463
DOE Contract Number:  
AC36-99-GO10337
Resource Type:
Conference
Resource Relation:
Conference: Prepared for the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4), 7-12 May 2006, Waikoloa, Hawaii
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; ELLIPSOMETRY; ENERGY CONVERSION; HETEROJUNCTIONS; OPTICAL PROPERTIES; OPTIMIZATION; PROCESSING; SILICON; SOLAR CELLS; THICKNESS; SPECTROSCOPY; PHOTOVOLTAIC; PV; SILICON HETEROJUNCTION SOLAR CELL; SPECTROSCOPIC ELLIPSOMETRY; HOT-WIRED CVD; IN SITU; EX SITU; SOLAR ENERGY; NREL; Solar Energy - Photovoltaics

Citation Formats

Levi, D., Iwaniczko, E., Page, M., Branz, H., and Wang T.. Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation). United States: N. p., 2006. Web.
Levi, D., Iwaniczko, E., Page, M., Branz, H., & Wang T.. Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation). United States.
Levi, D., Iwaniczko, E., Page, M., Branz, H., and Wang T.. Mon . "Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation)". United States. doi:. https://www.osti.gov/servlets/purl/894451.
@article{osti_894451,
title = {Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation)},
author = {Levi, D. and Iwaniczko, E. and Page, M. and Branz, H. and Wang T.},
abstractNote = {The summary of this report is that: in situ SE gives insight into growth mechanisms and accurate layer thickness; (2) ex situ SE measures completed device structures to determine integrated optical properties; and (3) the combination of in situ and ex situ SE provides a powerful method for pinpointing the effects of processing changes in actual SHJ devices and guiding optimization.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon May 01 00:00:00 EDT 2006},
month = {Mon May 01 00:00:00 EDT 2006}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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