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Title: Formation of ZnTe:Cu/Ti Contacts at High Temperature for CdS/CdTe Devices (Presentation)

Conference ·
OSTI ID:894427

The conclusions of this report are that Cu diffusion from a ZnTe:Cu contact causes good and bad things. The good (Cu in CdS < low 10{sup 18} cm{sup -3})--increase in CdTe N{sub A}-N{sub D} that leads to V{sub oc} and FF improvement. The bad (Cu in CdS > low 10{sup 18} cm{sup -3})--(1) possibly decreased of shunt resistance (?); (2) depletion width in CdTe can become too narrow for optimum current collection at J{sub MPP}; (3) donor reduction in CdS (significant FF loss in LIV); and (4) excessive Cu diffusion into CdS readily observed by red-light bias QE.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-99-GO10337
OSTI ID:
894427
Report Number(s):
NREL/PR-520-39845; TRN: US200701%%445
Resource Relation:
Conference: Prepared for the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4), 7-12 May 2006, Waikoloa, Hawaii
Country of Publication:
United States
Language:
English