Nanosecond Gating of Microstripline Microchannel Plate Framing Cameras: Characterization and Simulation
The soft x-ray microstripline microchannel plate (MCP) framing camera has become one of the workhorses of ICF diagnostics. Much progress has been made in making these diagnostics work well with gate times of 100 ps and below. Often weak input signal or source timing uncertainties dictate a requirement for longer gate times, preferably in the same instrument that also has fast gating capability. The large power-law dependence of MCP gain on applied voltage is useful in shortening the gating time of the microstripline camera. However, this sensitivity leads to tight constraints on the shape of the long duration electrical pulses that are needed to drive the MCP to produce experimentally desirable optical gating profiles. Simple modeling and measurements are used to better understand the character of the voltage pulses needed to achieve optical gate widths between 500 ps and {approx}2 ns.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 892789
- Report Number(s):
- UCRL-CONF-203569; TRN: US200623%%580
- Resource Relation:
- Conference: Presented at: 15th Topical Conference on High Temperature Plasma Diagnostics, San Diego, CA, United States, Apr 19 - Apr 22, 2004
- Country of Publication:
- United States
- Language:
- English
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