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Title: Measurements of a newly designed BPM for the Tevatron Electron Lens 2

Abstract

Fermilab has developed a second electron lens (TEL-2) for beam-beam compensation in the Tevatron as part of its Run II upgrade program. Operation of the beam position monitors (BPMs) in the first electron lens (TEL-1) showed a systematic transverse position difference between short proton bunches (2 ns sigma) and long electron pulses ({approx}1 us) of up to {approx}1.5 mm. This difference was attributed to frequency dependence in the BPM system. The TEL-2 BPMs utilize a new compact four plate design with grounding strips between plates to minimize crosstalk. In-situ measurements of these new BPMs are made using a stretched wire pulsed with both proton and electron beam formats. In addition, longitudinal impedance measurements of the TEL-2 are presented. Signal processing algorithm studies indicate that the frequency dependent transverse position offset may be reduced to {approx}0.1 mm for the beam structures of interest.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
892312
Report Number(s):
FERMILAB-CONF-06-140-AD
TRN: US0701362
DOE Contract Number:  
AC02-76CH03000
Resource Type:
Conference
Resource Relation:
Journal Name: AIP Conf.Proc.868:481-487,2006; Conference: Presented at 12th Beam Instrumentation Workshop (BIW06), Fermilab, Batavia, Illinois, 1-4 May 2006
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALGORITHMS; BEAM POSITION; DESIGN; ELECTRON BEAMS; ELECTRONS; FERMILAB; FERMILAB TEVATRON; FREQUENCY DEPENDENCE; IMPEDANCE; MONITORS; PLATES; PROCESSING; PROTONS; UNINTERRUPTIBLE POWER SUPPLIES; Instrumentation

Citation Formats

Scarpine, V.E., Fellenz, B., Kuznetsov, G., Kamerdzhiev, V., Olson, M., Shiltsev, V.D., Zhang, X.L., and /Fermilab. Measurements of a newly designed BPM for the Tevatron Electron Lens 2. United States: N. p., 2006. Web.
Scarpine, V.E., Fellenz, B., Kuznetsov, G., Kamerdzhiev, V., Olson, M., Shiltsev, V.D., Zhang, X.L., & /Fermilab. Measurements of a newly designed BPM for the Tevatron Electron Lens 2. United States.
Scarpine, V.E., Fellenz, B., Kuznetsov, G., Kamerdzhiev, V., Olson, M., Shiltsev, V.D., Zhang, X.L., and /Fermilab. Mon . "Measurements of a newly designed BPM for the Tevatron Electron Lens 2". United States. doi:. https://www.osti.gov/servlets/purl/892312.
@article{osti_892312,
title = {Measurements of a newly designed BPM for the Tevatron Electron Lens 2},
author = {Scarpine, V.E. and Fellenz, B. and Kuznetsov, G. and Kamerdzhiev, V. and Olson, M. and Shiltsev, V.D. and Zhang, X.L. and /Fermilab},
abstractNote = {Fermilab has developed a second electron lens (TEL-2) for beam-beam compensation in the Tevatron as part of its Run II upgrade program. Operation of the beam position monitors (BPMs) in the first electron lens (TEL-1) showed a systematic transverse position difference between short proton bunches (2 ns sigma) and long electron pulses ({approx}1 us) of up to {approx}1.5 mm. This difference was attributed to frequency dependence in the BPM system. The TEL-2 BPMs utilize a new compact four plate design with grounding strips between plates to minimize crosstalk. In-situ measurements of these new BPMs are made using a stretched wire pulsed with both proton and electron beam formats. In addition, longitudinal impedance measurements of the TEL-2 are presented. Signal processing algorithm studies indicate that the frequency dependent transverse position offset may be reduced to {approx}0.1 mm for the beam structures of interest.},
doi = {},
journal = {AIP Conf.Proc.868:481-487,2006},
number = ,
volume = ,
place = {United States},
year = {Mon May 01 00:00:00 EDT 2006},
month = {Mon May 01 00:00:00 EDT 2006}
}

Conference:
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