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Title: Adhesion and Thin-Film Module Reliability: Preprint

Abstract

Among the infrequently measured but essential properties for thin-film (T-F) module reliability are the interlayer adhesion and cohesion within a layer. These can be cell contact layers to glass, contact layers to the semiconductor, encapsulant to cell, glass, or backsheet, etc. We use an Instron mechanical testing unit to measure peel strengths at 90{sup o} or 180{sup o} and, in some cases, a scratch and tape pull test to evaluate inter-cell layer adhesion strengths. We present peel strength data for test specimens laminated from the three T-F technologies, before and after damp heat, and in one instance at elevated temperatures. On laminated T-F cell samples, failure can occur uniformly at any one of the many interfaces, or non-uniformly across the peel area at more than one interface. Some peel strengths are << 1 N/mm. This is far below the normal Instron mechanical testing unit Instron mechanical testing unit; glass interface values of >10 N/mm. We measure a wide range of adhesion strengths and suggest that adhesion measured under higher temperature and relative humidity conditions is more relevant for module reliability.

Authors:
;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
891468
Report Number(s):
NREL/CP-520-39732
TRN: US200621%%929
DOE Contract Number:
AC36-99-GO10337
Resource Type:
Conference
Resource Relation:
Conference: Presented at the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4), 7-12 May 2006, Waikoloa, Hawaii
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 47 OTHER INSTRUMENTATION; ADHESION; ENERGY CONVERSION; GLASS; HUMIDITY; RELIABILITY; TESTING; PV; MODULE RELIABILITY; INTERLAYER ADHESION; COHESION; CONTACT LAYERS; INSTRON MECHANICAL TESTING UNIT; Solar Energy - Photovoltaics; Silicon Materials and Devices

Citation Formats

McMahon, T. J., and Jorgensen, G. J. Adhesion and Thin-Film Module Reliability: Preprint. United States: N. p., 2006. Web. doi:10.1109/WCPEC.2006.279908.
McMahon, T. J., & Jorgensen, G. J. Adhesion and Thin-Film Module Reliability: Preprint. United States. doi:10.1109/WCPEC.2006.279908.
McMahon, T. J., and Jorgensen, G. J. Mon . "Adhesion and Thin-Film Module Reliability: Preprint". United States. doi:10.1109/WCPEC.2006.279908. https://www.osti.gov/servlets/purl/891468.
@article{osti_891468,
title = {Adhesion and Thin-Film Module Reliability: Preprint},
author = {McMahon, T. J. and Jorgensen, G. J.},
abstractNote = {Among the infrequently measured but essential properties for thin-film (T-F) module reliability are the interlayer adhesion and cohesion within a layer. These can be cell contact layers to glass, contact layers to the semiconductor, encapsulant to cell, glass, or backsheet, etc. We use an Instron mechanical testing unit to measure peel strengths at 90{sup o} or 180{sup o} and, in some cases, a scratch and tape pull test to evaluate inter-cell layer adhesion strengths. We present peel strength data for test specimens laminated from the three T-F technologies, before and after damp heat, and in one instance at elevated temperatures. On laminated T-F cell samples, failure can occur uniformly at any one of the many interfaces, or non-uniformly across the peel area at more than one interface. Some peel strengths are << 1 N/mm. This is far below the normal Instron mechanical testing unit Instron mechanical testing unit; glass interface values of >10 N/mm. We measure a wide range of adhesion strengths and suggest that adhesion measured under higher temperature and relative humidity conditions is more relevant for module reliability.},
doi = {10.1109/WCPEC.2006.279908},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon May 01 00:00:00 EDT 2006},
month = {Mon May 01 00:00:00 EDT 2006}
}

Conference:
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