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Title: The Optical Properties of a Polished Uranium Surface and its Epitaxial Oxide, and the Rate of Oxide Growth Determined by Spectrophotometry

Abstract

Wide-band reflectrometry and ellipsometry have been used to determine the optical properties n and k of freshly polished uranium and of the epitaxial oxide layer, and also the rate of oxide growth in air. Results for uranium metal as well as for epitaxial oxide are compared with single wavelength ellipsometry literature values.

Authors:
;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
889994
Report Number(s):
UCRL-PROC-217595
Journal ID: ISSN 1946--4274; TRN: US200620%%195
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Journal Volume: 893; Conference: Presented at: Materials Research Society Fall 2005, Boston, MA, United States, Nov 28 - Dec 02, 2005
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; AIR; ELLIPSOMETRY; OPTICAL PROPERTIES; OXIDES; SPECTROPHOTOMETRY; URANIUM; WAVELENGTHS

Citation Formats

Siekhaus, W, and Nelson, A. The Optical Properties of a Polished Uranium Surface and its Epitaxial Oxide, and the Rate of Oxide Growth Determined by Spectrophotometry. United States: N. p., 2005. Web. doi:10.1557/PROC-0893-JJ07-06.
Siekhaus, W, & Nelson, A. The Optical Properties of a Polished Uranium Surface and its Epitaxial Oxide, and the Rate of Oxide Growth Determined by Spectrophotometry. United States. doi:10.1557/PROC-0893-JJ07-06.
Siekhaus, W, and Nelson, A. Mon . "The Optical Properties of a Polished Uranium Surface and its Epitaxial Oxide, and the Rate of Oxide Growth Determined by Spectrophotometry". United States. doi:10.1557/PROC-0893-JJ07-06. https://www.osti.gov/servlets/purl/889994.
@article{osti_889994,
title = {The Optical Properties of a Polished Uranium Surface and its Epitaxial Oxide, and the Rate of Oxide Growth Determined by Spectrophotometry},
author = {Siekhaus, W and Nelson, A},
abstractNote = {Wide-band reflectrometry and ellipsometry have been used to determine the optical properties n and k of freshly polished uranium and of the epitaxial oxide layer, and also the rate of oxide growth in air. Results for uranium metal as well as for epitaxial oxide are compared with single wavelength ellipsometry literature values.},
doi = {10.1557/PROC-0893-JJ07-06},
journal = {},
number = ,
volume = 893,
place = {United States},
year = {Mon Dec 05 00:00:00 EST 2005},
month = {Mon Dec 05 00:00:00 EST 2005}
}

Conference:
Other availability
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