The Optical Properties of a Polished Uranium Surface and its Epitaxial Oxide, and the Rate of Oxide Growth Determined by Spectrophotometry
Wide-band reflectrometry and ellipsometry have been used to determine the optical properties n and k of freshly polished uranium and of the epitaxial oxide layer, and also the rate of oxide growth in air. Results for uranium metal as well as for epitaxial oxide are compared with single wavelength ellipsometry literature values.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 889994
- Report Number(s):
- UCRL-PROC-217595; TRN: US200620%%195
- Resource Relation:
- Journal Volume: 893; Conference: Presented at: Materials Research Society Fall 2005, Boston, MA, United States, Nov 28 - Dec 02, 2005
- Country of Publication:
- United States
- Language:
- English
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