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Title: Automated multivariate statistical analysis of SEM and STEM x-ray spectral images.

Abstract

No abstract prepared.

Authors:
;
Publication Date:
Research Org.:
Sandia National Laboratories
Sponsoring Org.:
USDOE
OSTI Identifier:
886889
Report Number(s):
SAND2005-6017C
TRN: US200617%%366
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Frontiers of Electron Microscopy in Materials Science 10, September 25-30, 2005, Vaals, Netherlands.
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTRA; MULTIVARIATE ANALYSIS; AUTOMATION

Citation Formats

Kotula, Paul Gabriel, and Keenan, Michael Robert. Automated multivariate statistical analysis of SEM and STEM x-ray spectral images.. United States: N. p., 2005. Web.
Kotula, Paul Gabriel, & Keenan, Michael Robert. Automated multivariate statistical analysis of SEM and STEM x-ray spectral images.. United States.
Kotula, Paul Gabriel, and Keenan, Michael Robert. Thu . "Automated multivariate statistical analysis of SEM and STEM x-ray spectral images.". United States.
@article{osti_886889,
title = {Automated multivariate statistical analysis of SEM and STEM x-ray spectral images.},
author = {Kotula, Paul Gabriel and Keenan, Michael Robert},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2005},
month = {9}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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