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Title: Systematic Evaluation of Jc Decrease in Thick Film Coated Conductors

Abstract

Address both thickness dependence of Jc, in thick film YBCO coated conductors through an application of a suite of new measurement techniques to thick film wire samples produced by commercially viable coated conductor technologies.

Authors:
;
Publication Date:
Research Org.:
University of Houston
Sponsoring Org.:
USDOE
OSTI Identifier:
885091
Report Number(s):
DOE/ID/14512
TRN: US200719%%187
DOE Contract Number:
FC07-03ID14512
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; THICKNESS; YTTRIUM OXIDES; BARIUM OXIDES; COPPER OXIDES; COATINGS; THERMODYNAMIC PROPERTIES

Citation Formats

Alex Ignatiev, and Dr. Amit Goyal. Systematic Evaluation of Jc Decrease in Thick Film Coated Conductors. United States: N. p., 2006. Web. doi:10.2172/885091.
Alex Ignatiev, & Dr. Amit Goyal. Systematic Evaluation of Jc Decrease in Thick Film Coated Conductors. United States. doi:10.2172/885091.
Alex Ignatiev, and Dr. Amit Goyal. Wed . "Systematic Evaluation of Jc Decrease in Thick Film Coated Conductors". United States. doi:10.2172/885091. https://www.osti.gov/servlets/purl/885091.
@article{osti_885091,
title = {Systematic Evaluation of Jc Decrease in Thick Film Coated Conductors},
author = {Alex Ignatiev and Dr. Amit Goyal},
abstractNote = {Address both thickness dependence of Jc, in thick film YBCO coated conductors through an application of a suite of new measurement techniques to thick film wire samples produced by commercially viable coated conductor technologies.},
doi = {10.2172/885091},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed May 10 00:00:00 EDT 2006},
month = {Wed May 10 00:00:00 EDT 2006}
}

Technical Report:

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