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Title: Quantitative analysis of microelectromechanical-based field effect transistors using scanning capacitance microscopy and device simulations.

Abstract

No abstract prepared.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Sandia National Laboratories
Sponsoring Org.:
USDOE
OSTI Identifier:
884702
Report Number(s):
SAND2006-0685J
TRN: US200616%%8
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Journal Article
Resource Relation:
Journal Name: Proposed for publication in Applied Physics Letters.
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; FIELD EFFECT TRANSISTORS; MICROSCOPY; MICROELECTRONICS; PERFORMANCE

Citation Formats

Nakakura, Craig Yoshimi, Okandan, Murat, Young, Ralph Watson, Draper, Bruce Leroy, and Anderson, Meredith Lynn. Quantitative analysis of microelectromechanical-based field effect transistors using scanning capacitance microscopy and device simulations.. United States: N. p., 2006. Web.
Nakakura, Craig Yoshimi, Okandan, Murat, Young, Ralph Watson, Draper, Bruce Leroy, & Anderson, Meredith Lynn. Quantitative analysis of microelectromechanical-based field effect transistors using scanning capacitance microscopy and device simulations.. United States.
Nakakura, Craig Yoshimi, Okandan, Murat, Young, Ralph Watson, Draper, Bruce Leroy, and Anderson, Meredith Lynn. Wed . "Quantitative analysis of microelectromechanical-based field effect transistors using scanning capacitance microscopy and device simulations.". United States. doi:.
@article{osti_884702,
title = {Quantitative analysis of microelectromechanical-based field effect transistors using scanning capacitance microscopy and device simulations.},
author = {Nakakura, Craig Yoshimi and Okandan, Murat and Young, Ralph Watson and Draper, Bruce Leroy and Anderson, Meredith Lynn},
abstractNote = {No abstract prepared.},
doi = {},
journal = {Proposed for publication in Applied Physics Letters.},
number = ,
volume = ,
place = {United States},
year = {Wed Feb 01 00:00:00 EST 2006},
month = {Wed Feb 01 00:00:00 EST 2006}
}