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Title: Skin Deep: Highlights of NREL Surface Analysis PV Research

Abstract

The Surface Analysis project provides measurement support and leadership for collaborative research activities involving surface chemistry and physics in all areas of the PV program. Significant results from the past fiscal year include the following: i) in-situ XPS, UPS, and AES studies of chemical-bath exposure of CIGS surfaces demonstrated that Group-III elements are preferentially removed from the surface, that type conversion of the surface occurs, and that the addition of a surfactant improves CdS deposition and thus device performance; ii) XPS studies of polyethylene terephthalate (PET) candidate backsheet materials have shown that plasma exposure prior to oxide-barrier deposition results in the formation of low-molecular-weight fragments that result in the formation of a weak interfacial layer that fails during damp-heat exposure; iii) an empirical relation was derived for the source geometry that leads to optimal film-thickness uniformity in rotating-substrate physical-vapor deposition (PVD) systems; and iv) PVD flux-distribution calculations were performed to develop a novel method for combinatorial thin-film synthesis.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
882803
Report Number(s):
NREL/CP-520-39001
DOE Contract Number:
AC36-99-GO10337
Resource Type:
Conference
Resource Relation:
Related Information: Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-1020060-2245; NREL/CD-520-38577)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; PHOTOVOLTAICS; SOLAR; SURFACE ANALYSIS; PV; NREL; Solar Energy - Photovoltaics

Citation Formats

Asher, S., Pankow, J., Perkins, C., Reedy, R., Teeter, G., and Young, M. Skin Deep: Highlights of NREL Surface Analysis PV Research. United States: N. p., 2005. Web.
Asher, S., Pankow, J., Perkins, C., Reedy, R., Teeter, G., & Young, M. Skin Deep: Highlights of NREL Surface Analysis PV Research. United States.
Asher, S., Pankow, J., Perkins, C., Reedy, R., Teeter, G., and Young, M. Tue . "Skin Deep: Highlights of NREL Surface Analysis PV Research". United States. doi:. https://www.osti.gov/servlets/purl/882803.
@article{osti_882803,
title = {Skin Deep: Highlights of NREL Surface Analysis PV Research},
author = {Asher, S. and Pankow, J. and Perkins, C. and Reedy, R. and Teeter, G. and Young, M.},
abstractNote = {The Surface Analysis project provides measurement support and leadership for collaborative research activities involving surface chemistry and physics in all areas of the PV program. Significant results from the past fiscal year include the following: i) in-situ XPS, UPS, and AES studies of chemical-bath exposure of CIGS surfaces demonstrated that Group-III elements are preferentially removed from the surface, that type conversion of the surface occurs, and that the addition of a surfactant improves CdS deposition and thus device performance; ii) XPS studies of polyethylene terephthalate (PET) candidate backsheet materials have shown that plasma exposure prior to oxide-barrier deposition results in the formation of low-molecular-weight fragments that result in the formation of a weak interfacial layer that fails during damp-heat exposure; iii) an empirical relation was derived for the source geometry that leads to optimal film-thickness uniformity in rotating-substrate physical-vapor deposition (PVD) systems; and iv) PVD flux-distribution calculations were performed to develop a novel method for combinatorial thin-film synthesis.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 01 00:00:00 EST 2005},
month = {Tue Nov 01 00:00:00 EST 2005}
}

Conference:
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