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Title: Defect Clusters: Approaches for Overcoming Their Detrimental Impact on Solar Cell Performance

Abstract

Our analyses show that defect clusters can lower the efficiency of multicrystalline silicon (mc-Si) solar cells by 2 to 4 absolute percentage points. This large loss can be recovered if impurities precipitated at the defect cluster sites can be gettered. We describe a new technique for gettering precipitated impurities.

Authors:
; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
882615
Report Number(s):
NREL/CP-520-38957
DOE Contract Number:  
AC36-99-GO10337
Resource Type:
Conference
Resource Relation:
Related Information: Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-1020060-2245; NREL/CD-520-38577)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; PHOTOVOLTAICS; SOLAR; DISLOCATION GENERATION; THERMAL STRESSES IN SI; PV; NREL; Solar Energy - Photovoltaics

Citation Formats

Sopori, B., Tan, T., and Carlson, D. Defect Clusters: Approaches for Overcoming Their Detrimental Impact on Solar Cell Performance. United States: N. p., 2005. Web.
Sopori, B., Tan, T., & Carlson, D. Defect Clusters: Approaches for Overcoming Their Detrimental Impact on Solar Cell Performance. United States.
Sopori, B., Tan, T., and Carlson, D. Tue . "Defect Clusters: Approaches for Overcoming Their Detrimental Impact on Solar Cell Performance". United States. doi:. https://www.osti.gov/servlets/purl/882615.
@article{osti_882615,
title = {Defect Clusters: Approaches for Overcoming Their Detrimental Impact on Solar Cell Performance},
author = {Sopori, B. and Tan, T. and Carlson, D.},
abstractNote = {Our analyses show that defect clusters can lower the efficiency of multicrystalline silicon (mc-Si) solar cells by 2 to 4 absolute percentage points. This large loss can be recovered if impurities precipitated at the defect cluster sites can be gettered. We describe a new technique for gettering precipitated impurities.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 01 00:00:00 EST 2005},
month = {Tue Nov 01 00:00:00 EST 2005}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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