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Title: Electro-Optical Characterization at NREL

Abstract

One of the core issues in all of the photovoltaics technologies is relating PV device performance to the methods and materials used to produce them. Due to the nature of PV devices, the electronic and optical properties of the materials are key to device performance. The relationship between materials growth and processing, the resulting electro-optical properties, and device performance can be extremely complex and difficult to determine without direct measurement of these properties. Accurate and timely measurement of the electro-optical properties as a function of device processing provides researchers and manufacturers with the knowledge they need to troubleshoot problems and develop the knowledge base necessary for reducing cost, maximizing efficiency, improving reliability, and enhancing manufacturability. The Electro-optical Characterization Team at NREL provides this support for all internal and external projects funded by the PV Program.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
882599
Report Number(s):
NREL/CP-520-38948
DOE Contract Number:
AC36-99-GO10337
Resource Type:
Conference
Resource Relation:
Related Information: Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-1020060-2245; NREL/CD-520-38577)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; 42 ENGINEERING; PHOTOVOLTAICS; SOLAR; ELECTRO-OPTICAL CHARACTERIZATION; PV; NREL; Solar Energy - Photovoltaics

Citation Formats

Keyes, B. M., Dippo, P., Gedvilas, L., Johnston, S., Levi, D., Metzger, W., and Sopori, B. Electro-Optical Characterization at NREL. United States: N. p., 2005. Web.
Keyes, B. M., Dippo, P., Gedvilas, L., Johnston, S., Levi, D., Metzger, W., & Sopori, B. Electro-Optical Characterization at NREL. United States.
Keyes, B. M., Dippo, P., Gedvilas, L., Johnston, S., Levi, D., Metzger, W., and Sopori, B. Tue . "Electro-Optical Characterization at NREL". United States. doi:. https://www.osti.gov/servlets/purl/882599.
@article{osti_882599,
title = {Electro-Optical Characterization at NREL},
author = {Keyes, B. M. and Dippo, P. and Gedvilas, L. and Johnston, S. and Levi, D. and Metzger, W. and Sopori, B.},
abstractNote = {One of the core issues in all of the photovoltaics technologies is relating PV device performance to the methods and materials used to produce them. Due to the nature of PV devices, the electronic and optical properties of the materials are key to device performance. The relationship between materials growth and processing, the resulting electro-optical properties, and device performance can be extremely complex and difficult to determine without direct measurement of these properties. Accurate and timely measurement of the electro-optical properties as a function of device processing provides researchers and manufacturers with the knowledge they need to troubleshoot problems and develop the knowledge base necessary for reducing cost, maximizing efficiency, improving reliability, and enhancing manufacturability. The Electro-optical Characterization Team at NREL provides this support for all internal and external projects funded by the PV Program.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 01 00:00:00 EST 2005},
month = {Tue Nov 01 00:00:00 EST 2005}
}

Conference:
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