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Title: Sub-38 nm resolution tabletop microscopy with 13 nm wavelengthlaser light

Abstract

No abstract prepared.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
OLLABORATION - National Science FoundationEngineering Research Center
OSTI Identifier:
881850
Report Number(s):
LBNL-60073
Journal ID: ISSN 0146-9592; OPLEDP; TRN: US200612%%860
DOE Contract Number:
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: Optics Letters; Journal Volume: 31; Journal Issue: 9; Related Information: Journal Publication Date: 05/01/2006
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; LASER RADIATION; MICROSCOPY; SPATIAL RESOLUTION; WAVELENGTHS; TECHNOLOGY ASSESSMENT

Citation Formats

Vaschenko, G., Brewer, C., Brizuela, F., Wang. Y, Larotonda,M.A., Luther, B.M., Marconi, M.C., Rocca, J.J., Menoni, C.S., Anderson,E.H., Chao, W., Harteneck, B.D., Liddle, J.A., Liu, Y., and Attwood, D.T.. Sub-38 nm resolution tabletop microscopy with 13 nm wavelengthlaser light. United States: N. p., 2005. Web.
Vaschenko, G., Brewer, C., Brizuela, F., Wang. Y, Larotonda,M.A., Luther, B.M., Marconi, M.C., Rocca, J.J., Menoni, C.S., Anderson,E.H., Chao, W., Harteneck, B.D., Liddle, J.A., Liu, Y., & Attwood, D.T.. Sub-38 nm resolution tabletop microscopy with 13 nm wavelengthlaser light. United States.
Vaschenko, G., Brewer, C., Brizuela, F., Wang. Y, Larotonda,M.A., Luther, B.M., Marconi, M.C., Rocca, J.J., Menoni, C.S., Anderson,E.H., Chao, W., Harteneck, B.D., Liddle, J.A., Liu, Y., and Attwood, D.T.. Mon . "Sub-38 nm resolution tabletop microscopy with 13 nm wavelengthlaser light". United States. doi:.
@article{osti_881850,
title = {Sub-38 nm resolution tabletop microscopy with 13 nm wavelengthlaser light},
author = {Vaschenko, G. and Brewer, C. and Brizuela, F. and Wang. Y and Larotonda,M.A. and Luther, B.M. and Marconi, M.C. and Rocca, J.J. and Menoni, C.S. and Anderson,E.H. and Chao, W. and Harteneck, B.D. and Liddle, J.A. and Liu, Y. and Attwood, D.T.},
abstractNote = {No abstract prepared.},
doi = {},
journal = {Optics Letters},
number = 9,
volume = 31,
place = {United States},
year = {Mon Dec 19 00:00:00 EST 2005},
month = {Mon Dec 19 00:00:00 EST 2005}
}
  • An innovative route for deep-submicrometer spatial resolution hard x-ray microscopy with tabletop x-ray source is proposed. A film of lithium fluoride (LiF) was used as imaging detector in contact mode. We present here the x-ray images recorded on LiF films of a Fresnel zone plate with submicrometer gold structures and of an onion cataphyll. The images were read with an optical confocal microscope in fluorescence mode. The measured spatial resolution was about 250 nm, i.e., close to the resolution limit of the confocal microscope. The advantages and drawbacks, and the possible improvements, of this route are discussed.
  • No abstract prepared.
  • We have demonstrated the efficient generation of sub-9-nm-wavelength picosecond laser pulses of microjoule energy at 1-Hz repetition rate with a tabletop laser. Gain-saturated lasing was obtained at =8.85 nm in nickel-like lanthanum ions excited by collisional electron-impact excitation in a precreated plasma column heated by a picosecond optical laser pulse of 4-J energy. Furthermore, isoelectronic scaling along the lanthanide series resulted in lasing at wavelengths as short as =7.36 nm. Simulations show that the collisionally broadened atomic transitions in these dense plasmas can support the amplification of subpicosecond soft-x-ray laser pulses.
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  • A transmission X-ray microscope (TXM) has been installed at the BL01B beamline at National Synchrotron Radiation Research Center in Taiwan. This state-of-the-art TXM operational in a range 8-11 keV provides 2D images and 3D tomography with spatial resolution 60 nm, and with the Zernike-phase contrast mode for imaging light materials such as biological specimens. A spatial resolution of the TXM better than 30 nm, apparently the best result in hard X-ray microscopy, has been achieved by employing the third diffraction order of the objective zone plate. The TXM has been applied in diverse research fields, including analysis of failure mechanismsmore » in microelectronic devices, tomographic structures of naturally grown photonic specimens, and the internal structure of fault zone gouges from an earthquake core. Here we discuss the scope and prospects of the project, and the progress of the TXM in NSRRC.« less