skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement

Abstract

An apparatus and method for determining properties of a conductive film is disclosed. A plurality of probe locations selected around a periphery of the conductive film define a plurality of measurement lines between each probe location and all other probe locations. Electrical resistance may be measured along each of the measurement lines. A lumped parameter model may be developed based on the measured values of electrical resistance. The lumped parameter model may be used to estimate resistivity at one or more selected locations encompassed by the plurality of probe locations. The resistivity may be extrapolated to other physical properties if the conductive film includes a correlation between resistivity and the other physical properties. A profile of the conductive film may be developed by determining resistivity at a plurality of locations. The conductive film may be applied to a structure such that resistivity may be estimated and profiled for the structure's surface.

Inventors:
 [1]
  1. Idaho Falls, ID
Publication Date:
Research Org.:
BECHTEL BWXT IDAHO LLC
OSTI Identifier:
880425
Patent Number(s):
US 6,965,836
Application Number:
10/828633
Assignee:
Battelle Energy Alliance, LLC (Idaho Falls, ID)
DOE Contract Number:  
AC07-99ID13727
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Richardson, John G. Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement. United States: N. p., 2005. Web.
Richardson, John G. Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement. United States.
Richardson, John G. 2005. "Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement". United States. https://www.osti.gov/servlets/purl/880425.
@article{osti_880425,
title = {Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement},
author = {Richardson, John G},
abstractNote = {An apparatus and method for determining properties of a conductive film is disclosed. A plurality of probe locations selected around a periphery of the conductive film define a plurality of measurement lines between each probe location and all other probe locations. Electrical resistance may be measured along each of the measurement lines. A lumped parameter model may be developed based on the measured values of electrical resistance. The lumped parameter model may be used to estimate resistivity at one or more selected locations encompassed by the plurality of probe locations. The resistivity may be extrapolated to other physical properties if the conductive film includes a correlation between resistivity and the other physical properties. A profile of the conductive film may be developed by determining resistivity at a plurality of locations. The conductive film may be applied to a structure such that resistivity may be estimated and profiled for the structure's surface.},
doi = {},
url = {https://www.osti.gov/biblio/880425}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 15 00:00:00 EST 2005},
month = {Tue Nov 15 00:00:00 EST 2005}
}

Works referenced in this record:

Electrical impedance tomography system using 3D finite element algorithm
conference, January 2000