Contoured Surface Eddy Current Inspection System

Patent · Tue Apr 08 00:00:00 EDT 2003

OSTI ID:880240

Batzinger, Thomas James ^[1]; Fulton, James Paul ^[2]; Rose, Curtis Wayne ^[3]; Perocchi, Lee Cranford ^[4]

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1. Burnt Hills, NY
2. Clifton Park, NY
3. Mechanicville, NY
4. Schenectady, NY

Eddy current inspection of a contoured surface of a workpiece is performed by forming a backing piece of flexible, resiliently yieldable material with a contoured exterior surface conforming in shape to the workpiece contoured surface. The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe is attached to the contoured exterior surface of the backing piece such that the probe faces the contoured surface of the workpiece to be inspected when the backing piece is disposed adjacent to the workpiece. The backing piece is then expanded volumetrically by inserting at least one shim into a slot in the backing piece to provide sufficient contact pressure between the probe and the workpiece contoured surface to enable the inspection of the workpiece contoured surface to be performed.

• Research Organization: General Electric Co., Boston, MA (United States)
• DOE Contract Number: FC21-95MC31176
• Assignee: General Electric Company (Niskayuna, NY)
• Patent Number(s): US 6545467
• Application Number: 10/697256
• OSTI ID: 880240
• Country of Publication: United States
• Language: English