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Title: Method And Apparatus For Evaluatin Of High Temperature Superconductors

Abstract

A technique for evaluation of high-T.sub.c superconducting films and single crystals is based on measurement of temperature dependence of differential optical reflectivity of high-T.sub.c materials. In the claimed method, specific parameters of the superconducting transition such as the critical temperature, anisotropy of the differential optical reflectivity response, and the part of the optical losses related to sample quality are measured. The apparatus for performing this technique includes pump and probe sources, cooling means for sweeping sample temperature across the critical temperature and polarization controller for controlling a state of polarization of a probe light beam.

Inventors:
 [1];  [2]
  1. Palo Alto, CA
  2. Stanford, CA
Publication Date:
Research Org.:
Stanford Univ., CA (United States)
OSTI Identifier:
879246
Patent Number(s):
US 5574562
Application Number:
08/359283
Assignee:
The Board of Trustees of the Leland Stanford Junior University (Stanford, CA)
DOE Contract Number:  
FG03-90ER14157
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Fishman, Ilya M, and Kino, Gordon S. Method And Apparatus For Evaluatin Of High Temperature Superconductors. United States: N. p., 1996. Web.
Fishman, Ilya M, & Kino, Gordon S. Method And Apparatus For Evaluatin Of High Temperature Superconductors. United States.
Fishman, Ilya M, and Kino, Gordon S. Tue . "Method And Apparatus For Evaluatin Of High Temperature Superconductors". United States. https://www.osti.gov/servlets/purl/879246.
@article{osti_879246,
title = {Method And Apparatus For Evaluatin Of High Temperature Superconductors},
author = {Fishman, Ilya M and Kino, Gordon S},
abstractNote = {A technique for evaluation of high-T.sub.c superconducting films and single crystals is based on measurement of temperature dependence of differential optical reflectivity of high-T.sub.c materials. In the claimed method, specific parameters of the superconducting transition such as the critical temperature, anisotropy of the differential optical reflectivity response, and the part of the optical losses related to sample quality are measured. The apparatus for performing this technique includes pump and probe sources, cooling means for sweeping sample temperature across the critical temperature and polarization controller for controlling a state of polarization of a probe light beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1996},
month = {11}
}

Patent:

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