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Title: High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy

Abstract

Three-dimensional diffraction microscopy offers the potential for high-resolution aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Critical issues in obtaining a high-quality image include: (1) Data collection--signal to noise, system stability, dynamic range, automation; (2) Alignment of diffraction patterns with respect to one another; (3) Assembly of the diffraction data into a diffraction volume; and (4) Efficient algorithms for applying phase retrieval techniques to the diffraction volume; (5) Stability of the three-dimensional phase retrieval process; (6) Techniques for determining the object support; and (7) Treatment of missing data, both within the beamstop region and elsewhere. They have obtained high-quality 3D reconstructions from X-ray diffraction data alone. This is an important step, as it does not require a low-resolution image to fill in the beamstop region.

Authors:
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
877916
Report Number(s):
UCRL-CONF-213044
TRN: US200608%%751
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Conference
Resource Relation:
Conference: Presented at: Coherence 2005, Porquerolles, France, Jun 14 - Jun 18, 2005
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ALGORITHMS; ALIGNMENT; AUTOMATION; DIFFRACTION; MICROSCOPY; RESOLUTION; STABILITY; X-RAY DIFFRACTION

Citation Formats

Barty, A. High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy. United States: N. p., 2005. Web.
Barty, A. High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy. United States.
Barty, A. Mon . "High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy". United States. https://www.osti.gov/servlets/purl/877916.
@article{osti_877916,
title = {High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy},
author = {Barty, A},
abstractNote = {Three-dimensional diffraction microscopy offers the potential for high-resolution aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Critical issues in obtaining a high-quality image include: (1) Data collection--signal to noise, system stability, dynamic range, automation; (2) Alignment of diffraction patterns with respect to one another; (3) Assembly of the diffraction data into a diffraction volume; and (4) Efficient algorithms for applying phase retrieval techniques to the diffraction volume; (5) Stability of the three-dimensional phase retrieval process; (6) Techniques for determining the object support; and (7) Treatment of missing data, both within the beamstop region and elsewhere. They have obtained high-quality 3D reconstructions from X-ray diffraction data alone. This is an important step, as it does not require a low-resolution image to fill in the beamstop region.},
doi = {},
url = {https://www.osti.gov/biblio/877916}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2005},
month = {6}
}

Conference:
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