What Can Be Learned From the BaBar Silicon Vertex Tracker Running Experience

Conference · Fri Feb 24 00:00:00 EST 2006

OSTI ID:876614

Re, V; Kirkby, D; Bruinsma, M; Curry, S; Berryhill, J; Burke, S; Callahan, D; Campagnari, C; Dahmes, B; Hale, D; Hart, P; Kyre, S; Levy, S; Long, O; Mazur, M; Richman, J; Stoner, J; Verkerke, W; Beck, T; Eisner, A M ; Kroseberg, J

No abstract prepared.

• Research Organization: SLAC National Accelerator Lab., Menlo Park, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-76SF00515
• OSTI ID: 876614
• Report Number(s): SLAC-REPRINT-2005-156; TRN: US200606%%674
• Resource Relation: Conference: Prepared for 5th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices (RESMDD 04), Florence, Italy, 10-13 Oct 2004
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
RADIATION EFFECTS
SEMICONDUCTOR MATERIALS
SILICON
Instrumentation
INST