Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces

Journal Article · Fri Jul 01 00:00:00 EDT 2005 · European Physical Journal. E, Soft Matter

DOI:https://doi.org/10.1140/epje/i2004-10147-4· OSTI ID:876432

Hu, Xuesong; Jiao, Xuesong; Narayanan, Suresh; Jiang, Zhang; K. Sinha, Sunil; Lurio, L. B.; Lal, Jyotsana

We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.

• Research Organization: Intense Pulsed Neutron Source (IPNS), Argonne National Laboratory (ANL), Argonne, IL (US); Northern Illlinois Univ.; Univ. of California
• Sponsoring Organization: USDOE
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 876432
• Journal Information: European Physical Journal. E, Soft Matter, Vol. 17, Issue 3; Related Information: 2005; ISSN 1292-8941
• Publisher: EDP Sciences
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
POLYMERS
INTERFACES
X-RAY DIFFRACTION
SURFACE TENSION
intense pulsed neutron source